Accelerated stress testing of potential induced degradation susceptibility of PV modules under different climatic conditions

Bora, Birinchi; Mondal, Som; Prasad, B. K.; Sastry, O.S.; Bangar, Manander; Tripathi, Arun Kumar; Banerjee, Chandan

doi:10.1016/j.solener.2021.05.020

Cited by 16 publications

(8 citation statements)

References 17 publications

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“…Leakage current magnitude increases with the voltage difference between the cells and the grounded frame. [ 150 ] As a result, the rate of PID will be faster for PV systems with higher voltage and for modules located at the end of the strings. However, an exact linear relationship was not found between the power losses and the magnitude of applied voltage.…”

Section: Pid‐impacting Factors and Limitation Solutionsmentioning

confidence: 99%

“…For fixed RH, the leakage current follows an Arrhenius relationship with respect to temperature [ 21,22,35,128,150,152,153 ] and Equation (4) has been established [ 152,153 ]

I (R H, V, T) = I_{0} (R H, V) \exp \frac{- E a (R H)}{k_{normalB} T}

where I (RH, V , T ) is the leakage current,

I_{0}

(RH, V ) a pre‐factor,

E_{normala}

is the activation energy,

k_{normalB}

the Boltzmann constant, and T the module's absolute temperature.…”

Section: Pid‐impacting Factors and Limitation Solutionsmentioning

confidence: 99%

“…For fixed RH, the leakage current follows an Arrhenius relationship with respect to temperature [21,22,35,128,150,152,153] and Equation ( 4) has been established [152,153] IðRH, V, TÞ…”

Section: Temperaturementioning

confidence: 99%

“…Leakage current magnitude and dominant pathways are both mainly controlled by humidity. [21,150,152] Under dry conditions, the surface conductivity of the front glass is low and leakage current is mainly observed at the module edges. [129] Under high humidity or wet conditions, a relatively high conductive film is formed on the front glass and leakage current perpendicular to the front glass becomes the predominant leakage path (see Figure 8) with values up to two orders of magnitude greater in case of rain.…”

Section: Humidity and Dewmentioning

confidence: 99%

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Review of Potential‐Induced Degradation in Bifacial Photovoltaic Modules

Molto

Mahmood

et al. 2023

Energy Tech

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Bifacial modules are increasingly deployed in the field and are expected to represent half of the market share within 10 years. Their rear structure differs from monofacial modules to allow additional light absorption. However, it brings new reliability challenges to address. In particular, the risk of potential‐induced degradation (PID) is increased as both module sides are impacted. Different PID processes have been identified in the literature: shunting type (PID‐s), polarization type (PID‐p), Na penetration type, and corrosion type (PID‐c). Their occurrence depends on the photovoltaic system configuration as well as the module's materials. Apart from PID‐s, PID processes are not well understood and extensive research is needed to elucidate the PID scenario and underlying mechanisms. Herein, current knowledge about PID processes and their impact on the main bifacial modules in the market are gathered with the aim to guide future research. Bifacial module technologies and leakage current paths leading to PID are described. Indoor and outdoor PID testing methods are detailed. For each bifacial module technology, the PID processes are investigated with their indicators, mechanism and recovery process. PID‐impacting factors and limitation solutions are finally reported and a state of the art on PID modeling is presented.

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Section: Pid‐impacting Factors and Limitation Solutionsmentioning

confidence: 99%

“…For fixed RH, the leakage current follows an Arrhenius relationship with respect to temperature [ 21,22,35,128,150,152,153 ] and Equation (4) has been established [ 152,153 ]

I (R H, V, T) = I_{0} (R H, V) \exp \frac{- E a (R H)}{k_{normalB} T}

where I (RH, V , T ) is the leakage current,

I_{0}

(RH, V ) a pre‐factor,

E_{normala}

is the activation energy,

k_{normalB}

the Boltzmann constant, and T the module's absolute temperature.…”

Section: Pid‐impacting Factors and Limitation Solutionsmentioning

confidence: 99%

“…For fixed RH, the leakage current follows an Arrhenius relationship with respect to temperature [21,22,35,128,150,152,153] and Equation ( 4) has been established [152,153] IðRH, V, TÞ…”

Section: Temperaturementioning

confidence: 99%

Section: Humidity and Dewmentioning

confidence: 99%

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Review of Potential‐Induced Degradation in Bifacial Photovoltaic Modules

Molto

Mahmood

et al. 2023

Energy Tech

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“…Embora a PID ocorra também em células monofaciais, ela causa mais danos em células bifaciais em embalagens de vidro / vidro, uma vez que o mecanismo pode ser acionado de ambos os lados. Arquiteturas de dispositivos mais intrincadas com camadas mais finas também parecem ser mais sensíveis a ele, sugerindo pesquisas críticas no campo de TOPCon e outros tipos de células avançados (Bora et al, 2021;Naumann et al, 2012;Nguyen et al, 2020).…”

Section: Causas E Mecanismos Do Pid Em Módulos Fvunclassified

Degradação Induzida Por Potencial (Pid) Em Módulos Fotovoltaicos

2022

Anais Congresso Brasileiro De Energia Solar - CBENS

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Os módulos fotovoltaicos (FV) em usinas de energia devem suportar altas tensões de polarização entre as camadas que compõem os módulos e a estrutura de montagem em que se encontram os módulos. Assim, esta alta tensão tem aumentado a degradação de módulos em campo prejudicando o desempenho do módulo fotovoltaico, ocasionando um grande problema para a indústria fotovoltaica. Este estresse de alta tensão resulta na degradação induzida por potencial (PIDpotencial induced degradation). Neste artigo será fornecida uma revisão da literatura, tendo como objetivo fornecer uma visão geral das pesquisas que foram realizadas para a compreensão do PID e a situação atual da pesquisa sobre o tema para módulos FV de silício cristalino. Este artigo consiste em três partes. Na primeira parte, são discutidas as possíveis causas do PID e o mecanismo de como essa degradação atua nos módulos de silício cristalino (c-Si), examinando como a temperatura, umidade e tensão estão correlacionadas no avanço do PID. Na segunda parte são abordados os testes usados atualmente para a avaliar a durabilidade de módulos FV para PID. Na terceira parte são apresentadas medidas preventivas contra PID a nível de célula, módulo e sistema.

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Luminance degradation test and life prediction of LED light at conventional stress using TPWRAM

Zhang,

Zhang

2023

J Mater Sci: Mater Electron

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Accelerated stress testing of potential induced degradation susceptibility of PV modules under different climatic conditions

Cited by 16 publications

References 17 publications

Review of Potential‐Induced Degradation in Bifacial Photovoltaic Modules

Review of Potential‐Induced Degradation in Bifacial Photovoltaic Modules

Degradação Induzida Por Potencial (Pid) Em Módulos Fotovoltaicos

Luminance degradation test and life prediction of LED light at conventional stress using TPWRAM

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