2020
DOI: 10.1021/acsaem.0c01163
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Absorber Delamination-Induced Shunt Defects in Alcohol-Based Solution-Processed Cu(In,Ga)(S,Se)2 Solar Modules

Abstract: Solution-processed chalcopyrite Cu­(In,Ga)­(S,Se)2 (CIGSSe) solar modules are promising alternatives to conventional crystalline silicon-based photovoltaic devices owing to their potential to lower production costs and compatibility with large-area flexible substrates. However, these modules typically exhibit a higher-than-expected cell-to-module loss, which, in most cases, is attributed to the emergence of critical shunt sites. In this study, we investigated the structural shunt defects induced by delaminatio… Show more

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Cited by 4 publications
(7 citation statements)
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“…First, we compared the XRD peaks of the MOCVD-prepared CIS sample with those of the CIGS samples prepared using the other deposition techniques, i.e., the three-stage co-evaporation and two-step solution processes [6,17]. Figure 2a-c shows the three main diffraction peaks of the chalcopyrite crystals in the (112), (204/220), and (116/312) planes, respectively [18].…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…First, we compared the XRD peaks of the MOCVD-prepared CIS sample with those of the CIGS samples prepared using the other deposition techniques, i.e., the three-stage co-evaporation and two-step solution processes [6,17]. Figure 2a-c shows the three main diffraction peaks of the chalcopyrite crystals in the (112), (204/220), and (116/312) planes, respectively [18].…”
Section: Resultsmentioning
confidence: 99%
“…Finally, AZO was deposited as TCO layers via RF sputtering. The preparation of the CIGS absorber layer using the two-step solution process has been described in detail elsewhere [6].…”
Section: Fabrication Of Cis-series Solar Cell Samplesmentioning
confidence: 99%
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“…We present an analysis of a CIGS mini-module by employing a system capable of both biased thermography and LIT. Through a comparison analysis, we demonstrate the efficacy of these two techniques and identify scenarios in which biased thermography performed adequately [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19]. We also provide an in-depth discussion of the advantages and limitations of each thermography method when diagnosing shunt defects in CIGS modules.…”
Section: Introductionmentioning
confidence: 96%
“…However, there remains a challenge in many laboratories where commercially available LIT systems are used without a comprehensive understanding of the respective strengths and drawbacks of each method. This study aimed to address this knowledge gap by conducting a comparative analysis of biased thermography and LIT, focusing on investigating shunt defects in CIGS modules [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19].…”
Section: Introductionmentioning
confidence: 99%