2003
DOI: 10.1109/tasc.2003.813955
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A YBCO multilayer process using surface-modified junction technology

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Cited by 12 publications
(8 citation statements)
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“…The interface-engineered junction (IEJ) [3] with a rampedge structure is a promising candidate for use in HTS integrated circuits, since small I c spreads were reported for such junctions [4,5]. However, the magnitude and the spread of I c have been found to significantly depend on various parameters including the surface roughness of the multilayers or the density of particles [6], and the deposition conditions for the counter-electrode [7].…”
Section: Introductionmentioning
confidence: 99%
“…The interface-engineered junction (IEJ) [3] with a rampedge structure is a promising candidate for use in HTS integrated circuits, since small I c spreads were reported for such junctions [4,5]. However, the magnitude and the spread of I c have been found to significantly depend on various parameters including the surface roughness of the multilayers or the density of particles [6], and the deposition conditions for the counter-electrode [7].…”
Section: Introductionmentioning
confidence: 99%
“…They have the advantages of low power consumption and high-speed operation at around 40 K, being much higher than the operation temperature of Nb circuits, that is 4.2 K. To realize HTS-SFQ devices, fabrication process of JJs integrated on a superconducting ground plane must be established. A few groups reported successful fabrication of JJs on the ground plane [2][3][4]. Excellent flatness and pure orientation are required for the lowest layer as a foundation of multilayer structures.…”
Section: Introductionmentioning
confidence: 99%
“…Excellent flatness and pure orientation are required for the lowest layer as a foundation of multilayer structures. Soutome et al [2] used a YBa 2 Cu 3 O y thin film for the ground plane. It requires the stoichiometric cation ratio to form mono-phasic films.…”
Section: Introductionmentioning
confidence: 99%
“…YBa 2 Cu 3 O y (YBCO) is a widely studied high temperature superconducting (HTSC) material from interests in fundamental physics and chemistry, whereas YBCO thin films attracted much attention in applied research because of their capability of carrying large critical current and possible candidates for device applications. Trilayer-type junctions [1][2][3][4][5] as well as ramp-edge junctions [6][7][8][9][10][11] based on YBCO thin films have been reported. Sato et al recently found that the modified barrier for YBCO trilayer junctions by sequential treatments, i.e., argon plasma bombardment, vacuum annealing and exposure to ozone show resistively and capacitively shunted junction (RCSJ) like currentvoltage characteristics.…”
Section: Introductionmentioning
confidence: 99%