A Y-domain magnetic thin film memory element

Lo, D. S.; Cosimini, G. J.; Zierhut, L.; Dean, R H; Paul, M. C.

doi:10.1109/tmag.1985.1064061

Cited by 11 publications

(1 citation statement)

References 2 publications

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“…The bistable nature of the domain pattern makes the element a possible candidate for information storage. [5,6] In addition, we were interested in these elements because their relatively low polarization, large topographic contrast, and magnetic fine structure make them challenging samples for full vector imaging using SEMPA.…”

Section: Introductionmentioning

confidence: 99%

Scanning electron microscopy with polarization analysis studies of Ni-Fe magnetic memory elements

et al. 1989

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This paper describes the use of Scanning Electron Microscopy with Polarization Analysis to quantitatively image the magnetic structure of permalloy magnetic memory elements. Various methods of determining the absolute magnitude and direction of the magnetization vector are described. The magnetic domain structures are observed as a function of ion milling time. During ion milling the surface composition is monitored by Auger analysis.

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Section: Introductionmentioning

confidence: 99%

Scanning electron microscopy with polarization analysis studies of Ni-Fe magnetic memory elements

et al. 1989

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Nanoimprint Technology for Patterned Magnetic Nanostructures

Chou

2007

Handbook of Magnetism and Advanced Magnetic Materials

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This chapter describes the principle of nanoimprint lithography, different nanoimprint forms and their relative merits and shortcomings, key factors in nanoimprinting (masks, materials, pressing methods and imprinting pressure uniformity, material dispensing methods, vacuum, mold separation), examples of nanoimprinting in magnetic nanostructure fabrication, control of magnetic structure properties by patterning, the principle of quantized magnetic disks (QMDs) (patterned magnetic media), and the fabrication and commercial future of QMDs. The invention and development of QMDs and nanoimprint are intertwined, and this history is briefly discussed. The chapter is primarily based on author's own research in the field in the last 16 years.

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Characterization of chevron‐shaped permalloy magnetic memory elements by four magnetic imaging techniques

Cameron

Eberle

1991

Scanning

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Scanning auger microscopy (SAM) and the recently developed scanning electron microscopy with polarization analysis (SEMPA) are easily combined analytical techniques which provide quantitative submicrometer images of X-, Y-, and Z-axis spin polarization components of magnetization. SAMEEMPA, along with three established magnetic imaging techniques (Bitter colloidal, longitudinal magneto-optic Kerr microscopy, and the Fresnel mode of Lorentz microscopy), was used t o characterize a chevron-shaped permalloy magnetic memory element. Reflected light and secondary electrons were used to image the topography, Auger electrons identified and imaged the elemental composition. Reflected light, transmitted electrons, and secondary electrons were used to image the magnetic microstructure. The Bitter colloidal images showed only the delineation of the domain walls, and the longitudinal magneto-optic Kerr microscopy images produced similar results. The Lorentz microscopy images provided the most qualitative magnetization information. SAMEEMPA was the only technique to combine elemental information and quantitative magnetization information with images having submicrometer resolution.

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A Y-domain magnetic thin film memory element

Cited by 11 publications

References 2 publications

Scanning electron microscopy with polarization analysis studies of Ni-Fe magnetic memory elements

Scanning electron microscopy with polarization analysis studies of Ni-Fe magnetic memory elements

Nanoimprint Technology for Patterned Magnetic Nanostructures

Characterization of chevron‐shaped permalloy magnetic memory elements by four magnetic imaging techniques

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