“…The diffraction peaks at 13.22, 19.47, and 24.18° correspond to the (−110), (020), and (120) planes of ZnMoO 4 (JCPDS: 35-0765), respectively, and other diffraction peaks located at 23.36, 26.58, 28.47, 32.14, 33.74, 36.91, 38.95, 40.34, 47.55, and 53.92° correspond to the (02–1), (220), (31–1), (112), (22–2), (400), (040), (330), (421), and (53–1) planes of NiMoO 4 (JCPDS: 45-0142), confirming the successful preparation of NZMO/NF at 450 and 500 °C. ,, Figure b shows the XRD patterns for the samples obtained without introducing Zn 2+ and Ni 2+ , respectively. When Ni 2+ was not added (blue line), the diffraction peaks at 31.77, 34.42, 36.25, 47.54, 56.60, 62.86, and 67.96° belonged to the (100), (002), (101), (102), (110), (103), and (112) planes of ZnO (JCPDS: 36-1451); no diffraction peaks of ZnMoO 4 were found . The peak of the sample without Zn 2+ at 2θ = 28.82° corresponds to the (220) crystal plane of NiMoO 4 (JCPDS: 33-0948 (black line)) .…”