2017 IEEE International Reliability Physics Symposium (IRPS) 2017
DOI: 10.1109/irps.2017.7936399
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A thin film TaN resistor reliability evaluation

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Cited by 4 publications
(1 citation statement)
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“…Since the central disadvantage of the thermal printhead is its shorter lifetime [20][21][22][23], the isolation of failure mechanisms and the design of more robust resistors would create a greater incentive for production and manufacturing. Park et al and Lim et al' researches [24,25] present studies on the subject of lifetime enhancement by changing the printhead micro structure and changing the metal composition and thickness of the resistor.…”
Section: Introductionmentioning
confidence: 99%
“…Since the central disadvantage of the thermal printhead is its shorter lifetime [20][21][22][23], the isolation of failure mechanisms and the design of more robust resistors would create a greater incentive for production and manufacturing. Park et al and Lim et al' researches [24,25] present studies on the subject of lifetime enhancement by changing the printhead micro structure and changing the metal composition and thickness of the resistor.…”
Section: Introductionmentioning
confidence: 99%