1997
DOI: 10.1063/1.1148399
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A synchrotron x-ray liquid surface spectrometer

Abstract: Articles you may be interested inIn situ X-ray investigation of changing barrier growth temperatures on InGaN single quantum wells in metalorganic vapor phase epitaxy J. Appl. Phys. 115, 094906 (2014); 10.1063/1.4867640 X-ray absorption fine structure spectrometer using a compact superconducting synchrotron radiation source Rev.

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Cited by 112 publications
(96 citation statements)
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“…A complete, detailed description of the experimental setup, as well as the temperature dependence of the reflectivity R q z ( ) for C 2 0 -, C 2 2 -, C 2 4 -, and C 3 0 -alkanol monolayers at the hexane/water interface was previously published [8,17]. The x-ray wavelength was λ = 0.825 Å ( Δλ / λ~2 × 10 −3 ).…”
Section: X-ray Reflectivitymentioning
confidence: 99%
See 1 more Smart Citation
“…A complete, detailed description of the experimental setup, as well as the temperature dependence of the reflectivity R q z ( ) for C 2 0 -, C 2 2 -, C 2 4 -, and C 3 0 -alkanol monolayers at the hexane/water interface was previously published [8,17]. The x-ray wavelength was λ = 0.825 Å ( Δλ / λ~2 × 10 −3 ).…”
Section: X-ray Reflectivitymentioning
confidence: 99%
“…These data are further modified by subtracting a background due primarily to scattering from the bulk liquids. The technique of x-ray reflectivity and its application to the study of liquid/liquid interfaces has been described previously in detail [8,[17][18][19]. We have used this technique to study molecular ordering and phase transitions in surfactant monolayers at oil/water interfaces [7-9, 13, 18, 20], the structure of neat oil/water interfaces [21][22][23][24], the adsorption of sodium ions at the oil/silica hydrosol interface [25], and the ordering of ions at the interface between two electrolyte solutions [26,27].…”
Section: X-ray Reflectivitymentioning
confidence: 99%
“…The scattering intensity I at the n-hexane -water interface was measured by a universal spectrometer for studying the liquid surfaces at the X19C station of the NSLS synchrotron [9]. In experiments, a focused monochromatic beam with the wavelength λ = 0.825 ± 0.002Å and an intensity of ∼ 10 10 photons/s was used.…”
mentioning
confidence: 99%
“…Unfortunately, relatively strong scattering in the bulk of the hydrocarbon solvent at λ ∼ 1Å prevents the application of the grazing diffraction method to study the in-plane crystal order at the liquidliquid interface. The transverse structure of the interface was studied by X-ray reflectometry with the use of synchrotron radiation at the X19C station of the NSLS synchrotron, which was equipped with a universal spectrometer for studying the surface of the liquid [13]. A bending magnet with a critical energy of ∼ 6 keV was a source of radiation for the X19C station.…”
mentioning
confidence: 99%