2017
DOI: 10.3390/computers6010008
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A Survey of Soft-Error Mitigation Techniques for Non-Volatile Memories

Abstract: Non-volatile memories (NVMs) offer superior density and energy characteristics compared to the conventional memories; however, NVMs suffer from severe reliability issues that can easily eclipse their energy efficiency advantages. In this paper, we survey architectural techniques for improving the soft-error reliability of NVMs, specifically PCM (phase change memory) and STT-RAM (spin transfer torque RAM). We focus on soft-errors, such as resistance drift and write disturbance, in PCM and read disturbance and w… Show more

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Cited by 23 publications
(7 citation statements)
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“…We now review some terms and concepts which are useful throughout this article. We refer the reader to previous work for a comprehensive background on non-volatile memories and their reliability issues [26][27][28], hardware architectures for machine learning [29], deep neural networks [30] spiking neural networks [1,31] and processing-in-memory [32].…”
Section: Background and Overviewmentioning
confidence: 99%
See 1 more Smart Citation
“…We now review some terms and concepts which are useful throughout this article. We refer the reader to previous work for a comprehensive background on non-volatile memories and their reliability issues [26][27][28], hardware architectures for machine learning [29], deep neural networks [30] spiking neural networks [1,31] and processing-in-memory [32].…”
Section: Background and Overviewmentioning
confidence: 99%
“…A hard fault refers to a situation where a cell is stuck at the value 0 or 1, which happens when the write endurance limit of a cell has been reached [34]. Resistance drift refers to change in the resistance of the cell over time and, hence, it can lead to a soft-error [28]. Sneak-paths are undesired paths for current-flow which exist in parallel to the desired path.…”
Section: Preliminariesmentioning
confidence: 99%
“…We finally provide an overview of research works by organizing them in different categories (Section 2.6). We refer the reader to prior works for more details on the working mechanism of NVMs [5,6], process variation [7], wear leveling [8], and encryption algorithms [9].…”
Section: Background and Overviewmentioning
confidence: 99%
“…MLC STT-RAM can be designed in two ways [17,[44][45][46]. In the 'series MTJ' design, two MTJs with disparate characteristics are vertically stacked, and in the 'parallel MTJ' design, the free layer is partitioned into soft and hard domains, each of which can store a bit.…”
Section: Mlc Stt-ram and Sot-rammentioning
confidence: 99%