A survey of cold cathode discharge tubes

Neale, D.M.

doi:10.1049/ree.1964.0018

Cited by 4 publications

(6 citation statements)

References 2 publications

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“…In electrical phase-change memory, Joule heating or indirect heating induces an amorphous-crystalline transition in the phase-change material used. 8) The thermal properties of the materials making up a memory device are therefore critical factors in device operation and must be investigated for effective device design. Moreover, the measurement of the absolute values of these thermal parameters is essential in order to obtain reliable results from numerical simulations of temperatures inside active devices.…”

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confidence: 99%

“…Sb-Te alloys are widely used as recording media for optical disks, as the functional layer of superresolution disks, 13,14) and as resistive-element materials in phase-change memory. 8) The thermal conductivity was measured using a nanosecond thermoreflectance measurement system (Nano-TheMS), a novel apparatus that can measure the thermal conductivity of nanometer-order thin films. 15,16) Sb 2 Te, Sb 2 Te 3 , and SbTe 9 were selected as representative Sb-Te alloys and their corresponding thermal conductivities were measured and compared with those of pure Sb and Te.…”

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Thermal Conductivity Measurements of Sb–Te Alloy Thin Films Using a Nanosecond Thermoreflectance Measurement System

Kuwahara

Сузукі

Taketoshi

et al. 2007

jjap

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Using a nanosecond thermoreflectance measurement system, which enables the measurement of the thermal conductivity of nanometer-scale thin films, we have measured the thermal conductivities of Sb 2 Te, Sb 2 Te 3 , SbTe 9 , Sb, and Te thin films at room temperature. We clarified that the thermal conductivities of Sb-Te alloys depend on the Sb and Te atomic ratios. A large change in thermal conductivity was observed in the vicinity of the composition ratio of Sb 2 Te 3 . We proposed that this large change may be attributable to the formation of an Sb atomic network in the crystalline structure of the Sb-Te alloy.

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confidence: 99%

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confidence: 99%

Thermal Conductivity Measurements of Sb–Te Alloy Thin Films Using a Nanosecond Thermoreflectance Measurement System

Kuwahara

Сузукі

Taketoshi

et al. 2007

jjap

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“…Without the series resistance, there is no control of the power dissipated in the antifuse during programming. 8 Programming under these conditions leads to a much lower ON-resistance as shown in Fig. 2.…”

Section: Methodsmentioning

confidence: 94%

A Thermal Model for the Initiation of Programming in Metal‐to‐Metal Amorphous‐Silicon Antifuses

Vasudevan¹,

Massoud²,

Fair³

1999

J. Electrochem. Soc.

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An antifuse is a programmable element which normally resides in a high-resistance state called the "OFF-state." It can be switched into a low-resistance state called the "ON-state" by the application of a high-voltage pulse. [1][2][3] We have previously reported on the energy considerations during the growth of a molten filament in metalto-metal amorphous-silicon antifuses, 4 and on the ON-state reliability of amorphous-silicon antifuses. 5 In this paper, we present a thermal model for the initiation of programming in these antifuses.The antifuses studied in this work are located in the via between two metal layers. The bottom metal electrode is Al-Si-Cu/TiW and the top metal electrode is Ti/TiW/Al-Si-Cu. The via is circular with diameter ranging from 0.5 to 2 m. The amorphous-silicon layer is deposited by plasma-enhanced chemical vapor deposition (PECVD) of SiH 4 at 400ЊC. The amorphous-silicon layer thickness ranges from 500 to 1500 Å. ExperimentalThe dependence of the current I af in the antifuse on the applied voltage V app is shown in Fig. 1. The amorphous-silicon antifuse is initially in the OFF-state. In this state, its resistance R OFF is on the order of several megaohms. It is programmed to a low-resistance state (ON-state) by applying a voltage across its electrode pads through a series resistance R ser . The voltage is applied using the HP4145B semiconductor parameter analyzer. The current through the antifuse is measured using the same HP4145B. The current at the initiation of programming is denoted by I pf and the corresponding voltage is V pf . The series resistance R ser controls the programming current I pp and the final ON-state resistance R ON . The resistance in the ON-state is on the order of 25 to 200 ⍀ and it depends on the programming conditions. 3,6,7 The programming voltage V pp and the series resistance R ser control the programming conditions. Without the series resistance, there is no control of the power dissipated in the antifuse during programming. 8 Programming under these conditions leads to a much lower ON-resistance as shown in Fig. 2. In this figure, seven devices were measured for each data point. In the case with no series resistance, the standard deviation ranged from a low value of 0.61 ⍀ to a high value of 0.88 ⍀. In the case where R ser ϭ 760 ⍀, the standard deviation of the antifuse ON-resistance ranged from a low value of 3.86 ⍀ to a high value of 7.05 ⍀.Before programming, the applied voltage appears entirely across the antifuse as R OFF >> R ser . In the ON-state, most of the voltage drop appears across the series resistance because R ON << R ser . This type of A thermal model for the initiation of programming in metal-to-metal amorphous-silicon antifuses is described. The current and field crowding at the edges of the via cause the temperature at the via corners to increase due to Joule heating. Programming is initiated when the temperature at the via edges reaches the melting temperature of amorphous silicon. The model presented in this work explains how the thickne...

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“…There is often need to prepare phase change materials based on chalcogenide glasses, which have considerable potential as devices to store information economically with excellent solid state memory properties [1][2][3]. The cooling rates achieved by the usual quenching of the melt (of the order of 10 2 -10 3 Ks À1 ) are often not sufficiently high enough to prepare bulk tellurium based chalcogenide materials over extended composition ranges [4].…”

Section: Introductionmentioning

confidence: 99%

Rapid quenching and glass formation in chalcogenide glasses: Preparation and properties of Ge–As–Te glasses over an extended composition ranges

Ramesh

2009

Journal of Non-Crystalline Solids

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A survey of cold cathode discharge tubes

Cited by 4 publications

References 2 publications

Thermal Conductivity Measurements of Sb–Te Alloy Thin Films Using a Nanosecond Thermoreflectance Measurement System

Thermal Conductivity Measurements of Sb–Te Alloy Thin Films Using a Nanosecond Thermoreflectance Measurement System

A Thermal Model for the Initiation of Programming in Metal‐to‐Metal Amorphous‐Silicon Antifuses

Rapid quenching and glass formation in chalcogenide glasses: Preparation and properties of Ge–As–Te glasses over an extended composition ranges

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