A study of microstructural and optical properties of nanocrystalline ceria thin films prepared by pulsed laser deposition

Balakrishnan, G.; Sundari, S. Tripura; Kuppusami, P.; Mohan, P. Chandra; Madapusi, Srinivasan; Mohandas, E.; Ganesan, V.; Sastikumar, D.

doi:10.1016/j.tsf.2010.12.013

Cited by 61 publications

(18 citation statements)

References 46 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Exposing ceria to reducing conditions has been reported to result in small changes in the bandgap of ceria [at higher energies (>3.5 eV) than those directly pertinent to our emission wavelengths, >720 nm, <1.72 eV]. The most pertinent change is an increased index of refraction, ∼2.2 to 2.7, which is consistent with the reduced emission intensity observed under reducing conditions for ceria . The higher index of refraction results in a higher reflectivity and lower emissivity.…”

Section: Discussionsupporting

confidence: 80%

“…[31] Exposing ceria to reducing conditions has been reportedt or esult in small changes in the bandgapo fc eria [32] [at highere nergies (> 3.5 eV) than those directly pertinent to our emission wavelengths, > 720 nm, < 1.72 eV].T he most pertinent change is an increased index of refraction, [32,33]~2 .2 to 2.7, which is consistent with the reduced emission intensity observed under reducing conditions for ceria. [34,35] The higher index of refraction resultsi nahigher reflectivity and lower emissivity.T he lower emissivity reduces the NIR intensity we observe as long as the intensitiesh ave ag reater contributionf rom SOC emission rathert han reflection from the surroundings. Strong evidence that the cell emission rather than reflection dominates in our studies is found by recognizing that lower intensities are observed for the regions with bare Au and ceria with Au underneath.…”

Section: Discussionmentioning

confidence: 99%

See 1 more Smart Citation

Operando Tracking of Electrochemical Activity in Solid Oxide Electrochemical Cells by using Near‐Infrared Imaging

et al. 2015

View full text Add to dashboard Cite

Near‐infrared (NIR) imaging is used in conjunction with near ambient pressure X‐ray photoelectron spectroscopy (APXPS) to study chemical and electrochemical redox processes on a ceria‐based solid oxide electrochemical cell (SOC). Electrochemical water electrolysis tests conducted in ambient operating conditions on standard SOCs show that NIR imaging can be used to spatially resolve the electrochemically active regions associated with an accumulation of Ce3+. These effective emissivity changes are attributed to changes in optical properties (e.g. the index of refraction) of ceria that occur upon reduction. These data correlate strongly with APXPS measurements, simultaneously supporting the model (near ambient conditions and single‐sided cell setup required by APXPS experiments) and the ability to elucidate mechanistic details on an operating SOC using an inexpensive, convenient NIR imaging technique.

show abstract

Section: Discussionsupporting

confidence: 80%

Section: Discussionmentioning

confidence: 99%

Operando Tracking of Electrochemical Activity in Solid Oxide Electrochemical Cells by using Near‐Infrared Imaging

et al. 2015

View full text Add to dashboard Cite

show abstract

“…The CeO 2 and ZrO 2 layers were deposited alternately to obtain a total of 25 bi-layers at an optimized oxygen partial pressure of 3u10 -2 mbar at room temperature [10]. The CeO 2 layer thickness was 10 nm, while the ZrO 2 layer thickness was varied as 10, 20 and 30 nm.…”

Section: Methodsmentioning

confidence: 99%

Thermal stability of CeO2/ZrO2 multilayer thin films prepared by pulsed laser deposition

Balakrishnan

Kuppusami

Murugesan

et al. 2011

Trans Indian Inst Met

Self Cite

View full text Add to dashboard Cite

Multilayers of CeO 2 /ZrO 2 thin films were deposited on Si (100) substrates using pulsed laser deposition at an optimized oxygen partial pressure of 3x10 -2 mbar and at room temperature. The CeO 2 layer thickness was 10 nm, while the ZrO 2 layer thickness was varied as 10, 20 and 30 nm. CeO 2 and ZrO 2 layers were deposited alternately to obtain 25 bilayers. High temperature x-ray diffraction (HTXRD) results showed that the multilayer films had cubic ceria and tetragonal ZrO 2. Thermal expansion coefficients were calculated for CeO 2 and t-ZrO 2 and found to increase with the decrease of ZrO 2 layer thickness. The cross sectional transmission electron microscopy (XTEM) of CeO 2 /ZrO 2 multilayer also indicated that ceria was found to be in cubic phase while zirconia contained predominantly tetragonal phase along with cubic phase in thermally annealed specimen.

show abstract

“…CeO 2 thin �lms can be prepared by several techniques, including spray pyrolysis [11], pulsed laser deposition [12], sputtering [13], and spin coating [14]. e latter is one of the most advantageous techniques owing to its versatility, effectiveness, and practicality.…”

Section: Introductionmentioning

confidence: 99%

Cerium Dioxide Thin Films Using Spin Coating

Channei

Nakaruk

Phanichphant

et al. 2013

Journal of Chemistry

View full text Add to dashboard Cite

Cerium dioxide (CeO 2 ) thin �lms with varying Ce concentrations (0.1 to 0.9 M, metal basis) were deposited on soda-lime-silica glass substrates using spin coating. It was found that all �lms exhibited the cubic �uorite structure a�er annealing at 500 ∘ C for 5 h. e laser Raman microspectroscopy and GAXRD analyses revealed that increasing concentrations of Ce resulted in an increase in the degree of crystallinity. FI� and FESEM images con�rmed the laser Raman and GAXRD analyses results owing to the predicted increase in �lm thickness with increasing Ce concentration. However, porosity and shrinkage (drying) cracking of the �lms also increased signi�cantly with increasing Ce concentrations. UV-VIS spectrophotometry data showed that the transmission of the �lms decreased with increasing Ce concentrations due to the increasing crack formation. Furthermore, a red shi� was observed with increasing Ce concentrations, which resulted in a decrease in the optical indirect band gap.

show abstract

A study of microstructural and optical properties of nanocrystalline ceria thin films prepared by pulsed laser deposition

Cited by 61 publications

References 46 publications

Operando Tracking of Electrochemical Activity in Solid Oxide Electrochemical Cells by using Near‐Infrared Imaging

Operando Tracking of Electrochemical Activity in Solid Oxide Electrochemical Cells by using Near‐Infrared Imaging

Thermal stability of CeO2/ZrO2 multilayer thin films prepared by pulsed laser deposition

Cerium Dioxide Thin Films Using Spin Coating

Contact Info

Product

Resources

About