Thermal stability of CeO2/ZrO2 multilayer thin films prepared by pulsed laser deposition

Balakrishnan, G.; Kuppusami, P.; Murugesan, S.; Ghosh, C.; Divakar, R.; Mohandas, E.; Sastikumar, D.

doi:10.1007/s12666-011-0060-2

Cited by 2 publications

(2 citation statements)

References 13 publications

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“…These observations are consistent with other experiments, including our own, where alumina layers have been replaced by ceria [41][42][43][44][45][46][47] or yttria. [48][49][50][51][52][53][54] In the ceria/zirconia multilayer system the zirconia nanocrystallites have been observed to be stabilized in the tetragonal phase even at room temperature, whereas the thermally annealed CeO 2 /ZrO 2 multilayers at ∼1473 K shows the formation of solid solutions near the interfaces.…”

Section: Resultssupporting

confidence: 93%

HRTEM investigation of phase stability in alumina–zirconia multilayer thin films

et al. 2015

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Phase stability of nanostructured thin films can be significantly different from the stability of the same materials in bulk form because of the increased contribution from surface and interface effects. Zirconia (ZrO 2), stabilized in tetragonal and cubic phases, is a technologically important material and is used for most high temperature applications. In literature, zirconia can be found to be stabilized in its high temperature phases down to room temperature via two routes, doping with divalent or trivalent cations and crystallite size controls. Apart from these, in the alumina/zirconia thin-film multilayer system, a constraining effect on the zirconia layers provides another route to stabilization of the tetragonal zirconia phase at room temperature. However, in such nanostructured geometries, at high temperatures, the small diffusion lengths involved can influence the phase stability. The present work deals with the high-resolution transmission electron microscope (HRTEM) studies of pulsed laser ablated aluminazirconia thin-film multilayers in the as deposited state and annealed up to 1473 K at 2 × 10 −5 mbar. Conventional techniques such as X-ray diffraction lack the ability to detect localized phase changes at nanometre length scales and also for the low volume fraction of newly formed phases. Cross-sectional HRTEM techniques have been successful in detecting and characterizing these interactions.

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Section: Resultssupporting

confidence: 93%

HRTEM investigation of phase stability in alumina–zirconia multilayer thin films

et al. 2015

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“…Barshilia et al [21] have deposited TiN/CrN multilayers by sputtering technique and studied the thermal stability of the multilayers by HTXRD. Balakrishnan et al [10,11] have analyzed the thermal stability and thermal expansion behaviour of ZrO 2 /Al 2 O 3 and CeO 2 / ZrO 2 multilayer films deposited by pulsed laser (PLD) technique. Barshilia et al [12] have prepared ZrO 2 /Al 2 O 3 and ZrO 2 /Y 2 O 3 by sputtering technique and analyzed the microstructural and nanomechanical properties of the films.…”

Section: Introductionmentioning

confidence: 99%

Thermal stability and thermal expansion behaviour of ZrO2/Y2O3 multilayers deposited by pulsed laser deposition technique

Mishra

Kuppusami

Murugesan

et al. 2015

Materials Chemistry and Physics

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Thermal stability of CeO2/ZrO2 multilayer thin films prepared by pulsed laser deposition

Cited by 2 publications

References 13 publications

HRTEM investigation of phase stability in alumina–zirconia multilayer thin films

HRTEM investigation of phase stability in alumina–zirconia multilayer thin films

Thermal stability and thermal expansion behaviour of ZrO2/Y2O3 multilayers deposited by pulsed laser deposition technique

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