2001
DOI: 10.1016/s0924-0136(01)01045-7
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A study of carrier motion on a dual-face CMP machine

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Cited by 22 publications
(15 citation statements)
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“…Further, a quantitative analysis [ 19 ] has been also conducted to assess the uniformity of trajectories by multiple abrasive particles on workpiece by the assistance of Matlab according to the following steps:…”
Section: Evaluation Of Surface Quality With the Novel Driving Systmentioning
confidence: 99%
“…Further, a quantitative analysis [ 19 ] has been also conducted to assess the uniformity of trajectories by multiple abrasive particles on workpiece by the assistance of Matlab according to the following steps:…”
Section: Evaluation Of Surface Quality With the Novel Driving Systmentioning
confidence: 99%
“…The percentage ratio of the standard deviation of thickness relative to the averaged value was used to calculate the WIWNU [12][13][14]. A surface profile topography system (KLA-Tencor HRP-350) was used to measure the surface roughness and the Cu dishing on Si wafers.…”
Section: Cmp Experiments and Characterizationsmentioning
confidence: 99%
“…During machining, the effects of different polishing parameters for polishing are apparent.The performance test of polishing machine mainly checks polishing quality in all kinds of pressure. According to the previous study, polishing quality depends on surface quality of sample [5] .…”
Section: Liquid-provide-system Design With Variable Pressure Regulmentioning
confidence: 99%