Proceedings International Test Conference 2001 (Cat. No.01CH37260)
DOI: 10.1109/test.2001.966689
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A study of bridging defect probabilities on a Pentium (TM) 4 CPU

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Cited by 66 publications
(28 citation statements)
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“…The actual model is highly dependent on geometrical characteristics of layout, where maintaining correspondence between physical and electrical parameters remains as a problem that needs to be solved. In the transistor level simulations this layer can be excluded, considering that more than 80% [7] of signal errors in modern circuits are due to global signals stuck-at supply or ground.…”
Section: Lv3mentioning
confidence: 99%
“…The actual model is highly dependent on geometrical characteristics of layout, where maintaining correspondence between physical and electrical parameters remains as a problem that needs to be solved. In the transistor level simulations this layer can be excluded, considering that more than 80% [7] of signal errors in modern circuits are due to global signals stuck-at supply or ground.…”
Section: Lv3mentioning
confidence: 99%
“…The four-way bridging fault model was defined to aid in generating effective manufacturing tests for static defects in industrial designs [3]- [4]. We denote a fourway bridging fault by (g /a ,h =a ), where g and h are lines and a ∈ {0,1}.…”
Section: Four-way Bridging Faultsmentioning
confidence: 99%
“…In Section 2 we demonstrate that the four-way bridging fault model from [3]- [4] is non-robust. For similar reasons, the AND-type and OR-type bridging fault models are also non-robust.…”
Section: Introductionmentioning
confidence: 99%
“…Considering the robust bridging fault model defined in this work and the four-way bridging fault model [3]- [4], we show later that F robust is a subset of F in the sense that targeting faults in F robust implies that four-way bridging faults are being targeted. In this case, there is no waste in test generation effort when considering the faults in F robust .…”
Section: Introductionmentioning
confidence: 99%