2020 IEEE 15th International Conference on Solid-State &Amp; Integrated Circuit Technology (ICSICT) 2020
DOI: 10.1109/icsict49897.2020.9278016
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A Simple and Efficient Fuse-Trimming Circuit for Analog Design

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Cited by 4 publications
(3 citation statements)
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“…The reliability of technical objects (which is a separate scientific domain) considers fuse-links to be an anti-damage subsystem (alternatively dubbed as anti-failure) [38][39][40]. Solutions that directly precede its tripping are, above all, shielding and intervention subsystems [41][42][43][44].…”
Section: Technical and Functional Properties Of Fuse-linksmentioning
confidence: 99%
“…The reliability of technical objects (which is a separate scientific domain) considers fuse-links to be an anti-damage subsystem (alternatively dubbed as anti-failure) [38][39][40]. Solutions that directly precede its tripping are, above all, shielding and intervention subsystems [41][42][43][44].…”
Section: Technical and Functional Properties Of Fuse-linksmentioning
confidence: 99%
“…Electrical resistance of the fuse after it blows increases approximately a million times. In [9], an NMOS transistor controlled by a NOR gate is used to blow the fuse. In [10], the fuse blowing by connecting voltages of 1.5 V and 2 V is shown as illustrative comparison.…”
Section: Calibration Techniquesmentioning
confidence: 99%
“…If the circuit requires a calibration, the additional calibration elements are added to the circuit by blowing the fuses. The disadvantages of this method include the increased area of the sub-circuit and its invasive character, as the fuses are blown by a laser or high current [14] [15].…”
Section: Motivationmentioning
confidence: 99%