1998
DOI: 10.1016/s0955-2219(97)00162-3
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A silicon-29 MAS–NMR study of α-silicon nitride and amorphous silicon oxynitride fibres

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Cited by 27 publications
(23 citation statements)
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“…[1] In order to reduce the interconnection capacitance, many low k materials have been developed using different methods, such as CVD, spin coating, liquid-phase deposition, porous film formation techniques, and air bridge techniques. [2] Of particular interest are CVD techniques, which have the advantage of being able to completely fill narrow features with a high aspect ratio better than other deposition techniques, and are also generally considered compatible with damascene process flows. Furthermore, a layered structure that promotes adhesion can be easily fabricated by changing the source compounds, so the deposition of low k thin films by CVD appears promising.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…[1] In order to reduce the interconnection capacitance, many low k materials have been developed using different methods, such as CVD, spin coating, liquid-phase deposition, porous film formation techniques, and air bridge techniques. [2] Of particular interest are CVD techniques, which have the advantage of being able to completely fill narrow features with a high aspect ratio better than other deposition techniques, and are also generally considered compatible with damascene process flows. Furthermore, a layered structure that promotes adhesion can be easily fabricated by changing the source compounds, so the deposition of low k thin films by CVD appears promising.…”
Section: Methodsmentioning
confidence: 99%
“…[1] Si 3 N 4 materials have interesting properties, such as corrosion and creep resistance, and high strength at elevated temperatures. [2] Recently, there has been considerable interest in advanced, non-oxide, Si-based materials synthesized from inorganic silicon precursors. [3,4] A broad range of such polymer precursors is now available for a wide range of ceramic phase synthesis.…”
mentioning
confidence: 99%
“…-type tetrahedrons. Furthermore, the quadrupole moment of the La 3 + ions broadens the signals and shifts them to lower chemical shift values as compared to other (oxo)nitridosilicates [16][17][18] and impedes the detailed interpretation of chemical shifts. In general, the obtained NMR spectrum with its strongly overlapping signals is in accordance with the crystal structure.…”
Section: High-resolution Electron Microscopymentioning
confidence: 99%
“…The stoichiometry of amorphous silicon nitride can be expressed as Si 1−x N x :H y [24] and can also have the composition Si-N 4(1−x)/3 O 2x . Nitrogen and oxygen atoms are bonded to 3 and 2 silicon atoms, respectively [25]. The XPS peak of Si 2p can be decomposed into two contributions of the silicon in Si 3 N 4 and SiO 2 compounds.…”
Section: Amorphous Silicon Nitridementioning
confidence: 99%
“…Comparison of the intensity of Si 2p peaks which correspond to SiO 2 and Si 3 N 4 phases, suggests that thickness of the possibly superficial layer of silicon oxide does not exceed 0.8-1 nm. Moreover, it is possible that the oxygen detected by XPS belongs to the presence of Si-N 3 O tetrahedrons embedded on the surface of the structure of the ␣-Si 3 N 4 [25].…”
Section: ␣-Si 3 Nmentioning
confidence: 99%