Proceedings. International Test Conference
DOI: 10.1109/test.2002.1041802
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A set of benchmarks for modular testing of SOCs

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Cited by 260 publications
(161 citation statements)
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“…12 Bandwidth under-utilization due to idle bits as many ports as possible and tries to generate a wrapper design with minimal test length. As input we use the SOCs g1023, p93791, and a586710 of the ITC'02 SOC Test Benchmark Set [22]. For each core we assume for every 100 inputs and 100 outputs one input and one output port with a word width w = 32 using the AXI protocol [4]; cores with a big amount of i/o-terminals will therefore have a bigger bandwidth compared to cores with a small amount of i/o-terminals.…”
Section: Resultsmentioning
confidence: 99%
“…12 Bandwidth under-utilization due to idle bits as many ports as possible and tries to generate a wrapper design with minimal test length. As input we use the SOCs g1023, p93791, and a586710 of the ITC'02 SOC Test Benchmark Set [22]. For each core we assume for every 100 inputs and 100 outputs one input and one output port with a word width w = 32 using the AXI protocol [4]; cores with a big amount of i/o-terminals will therefore have a bigger bandwidth compared to cores with a small amount of i/o-terminals.…”
Section: Resultsmentioning
confidence: 99%
“…For the experiments we have used the following three ITC'02 benchmark designs: d695, g1023, and p34395 [18]. The input characteristics for the designs are collected in Table 2 where Column one contains the name of the design and Column two the number of tests given as input.…”
Section: Resultsmentioning
confidence: 99%
“…We have implemented the technique described earlier, and we have in the experiments made use of five ITC'02 benchmarks [28], d281, d695, p22810, p34392 and p93791. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…We have defined a test quality metric based on defect probability, fault coverage and the number of applied vectors that is used in the proposed test data selection scheme. We have implemented our technique and the experiments on several ITC'02 benchmarks [28] at reasonable CPU times show that high test quality can be achieved by careful selection of test data. Further, our technique can be used to shorten the test application time for a given test quality value.…”
Section: Discussionmentioning
confidence: 99%
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