Proceedings of IEEE 3rd Asian Test Symposium (ATS)
DOI: 10.1109/ats.1994.367253
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A sequential redundant fault identification scheme and its application to test generation

Hsing-Chung Liang
1
,
Chung Len Lee
2
,
J.E. Chen3
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Cited by 5 publications
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References 13 publications
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Combinational ATPG theorems for identifying untestable faults in sequential circuits

Agrawal
1
,
Chakradhar2
1995
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
53
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6
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Combinational ATPG theorems for identifying untestable faults in sequential circuits

Agrawal
1
,
Chakradhar2
1995
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
53
0
6
0
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Redundancy identification using transitive closure

Agrawal
1
,
Bushnell2,
Qi3
Proceedings of the Fifth Asian Test Symposium (ATS'96)
9
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5
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Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors

Deligiannis,
Faller,
Guglielminetti
et al. 2023
2023 IEEE 32nd Asian Test Symposium (ATS)
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