2019
DOI: 10.1515/nanoph-2018-0197
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A semi-empirical integrated microring cavity approach for 2D material optical index identification at 1.55 μm

Abstract: Atomically thin two-dimensional (2D) materials provide a wide range of basic building blocks with unique properties, making them ideal for heterogeneous integration with a mature chip platform for advances in optical communication technology. Control and understanding of the precise value of the optical index of these materials, however, is challenging, due to the small lateral flake dimension. Here we demonstrate a semiempirical method to determine the index of a 2D material (nMoTe2 of 4.36+0.011i) near telec… Show more

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Cited by 30 publications
(16 citation statements)
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“…The Y-junctions used fair an average insertion loss of 0.28 ± 0.02 dB each 48 . Previously we found similar TM grating coupler losses to be 8 dB/coupler on the same SOI platform 49 . Neglecting the fabrication variation that might arise from separate multi project runs, we can roughly estimate the waveguide bending losses as 0.6 dB/bend from our structure with all bending radii of 60 μm maintained constant throughout the design (i.e.…”
Section: Introductionsupporting
confidence: 59%
“…The Y-junctions used fair an average insertion loss of 0.28 ± 0.02 dB each 48 . Previously we found similar TM grating coupler losses to be 8 dB/coupler on the same SOI platform 49 . Neglecting the fabrication variation that might arise from separate multi project runs, we can roughly estimate the waveguide bending losses as 0.6 dB/bend from our structure with all bending radii of 60 μm maintained constant throughout the design (i.e.…”
Section: Introductionsupporting
confidence: 59%
“…The spectral response of the MRR integrated device was measured using a broadband laser (AEDFA-PA-30-B-FA) injected into the grating coupler optimized for the TM mode propagation [46]. The light output from the MRR was coupled to the output fiber and detected by the optical spectral analyzer (OSA202) [47]. The experimental setup for measuring the photodetector devices is shown in Fig.…”
Section: Device Measurementmentioning
confidence: 99%
“…We therefore emphasize the role of using integrated photonic devices for material characterization. 48,49 In Fig. 8a we show an example of the optical loss in MoS2 measured by integration in a micro-ring resonator.…”
Section: Using Integrated Photonic Devices For Materials Characteriza...mentioning
confidence: 99%