2016
DOI: 10.1109/lmwc.2016.2555940
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A Scalable Active Compensatory Sub-Circuit for Accurate GaN HEMT Large Signal Models

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Cited by 11 publications
(6 citation statements)
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“…These transistors, mostly MOSFETs and IGBTs, are made from materials such as silicon carbide (SiC), gallium nitride (GaN), indium phosphide (InP), aluminum gallium nitride (AlGaN), etc. to list just a few, have continued to show a lot of promise as improvements are being made faster and faster as the different researches surface [171][172][173][174][175][176][177][178][179][180][181][182][183]. Taking advantage of this technology, manufacturers of power electronic switches can now begin to look into making the four quadrant switches.…”
Section: Discussionmentioning
confidence: 99%
“…These transistors, mostly MOSFETs and IGBTs, are made from materials such as silicon carbide (SiC), gallium nitride (GaN), indium phosphide (InP), aluminum gallium nitride (AlGaN), etc. to list just a few, have continued to show a lot of promise as improvements are being made faster and faster as the different researches surface [171][172][173][174][175][176][177][178][179][180][181][182][183]. Taking advantage of this technology, manufacturers of power electronic switches can now begin to look into making the four quadrant switches.…”
Section: Discussionmentioning
confidence: 99%
“…Non-linear components of the unit GaN-HEMT included the gate-source capacitor (C gs ), gate-drain capacitor (C gd ), and drain-source capacitor (C ds ) [9,12,20]. Each component was extracted based on the measured S-parameter of a wide operation range, and based on the extracted data, the nonlinear capacitors were empirically modeled using continuous and differentiable functions [9][10][11][12][13][14][15]. The modeled non-linear components are expressed as follows:…”
Section: Modeling the Non-linear Capacitorsmentioning
confidence: 99%
“…In [12], a channel current considering the device physics was proposed. Most of the previous transistor models with various output power capacities are directly based on the measured results for the transistor itself [12][13][14][15][16]. However, in the case of transistors with a high output power capacity, it is very difficult to obtain an accurate large-signal model directly.…”
Section: Introductionmentioning
confidence: 99%
“…The interest in GaN high‐electron mobility transistors (HEMTs) is strongly linked to their exceptional capabilities for high power and high‐frequency applications such as satellite communications and automotive radars. Thence, modeling and characterization of GaN HEMT devices at high frequency have attracted much attention from many researchers to provide accurate models to circuit designers 1–5 . However, each model requires precise extraction of its small‐signal equivalent circuit model (EC‐SSM) parameters 6–12 .…”
Section: Introductionmentioning
confidence: 99%