2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2014
DOI: 10.1109/dft.2014.6962106
|View full text |Cite
|
Sign up to set email alerts
|

A runtime manager for gracefully degrading SoCs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2016
2016
2016
2016

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
references
References 12 publications
0
0
0
Order By: Relevance