A rotating-compensator fourier ellipsometer

Hauge, P.S.; Dill, F.H.

doi:10.1016/0030-4018(75)90012-7

Cited by 102 publications

(49 citation statements)

References 11 publications

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“…1, the reflected light from the surface of the sample passes through the rotating compensator and the linear polarizer before detection by the CCD camera. In this system, the detected signal intensity I, is described as a function of the angle of the compensator, θ m , as, 24,25 …”

Section: Methodsmentioning

confidence: 99%

Magneto-optic Kerr effect CCD imaging with polarization modulation technique

et al. 2017

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We have developed a magneto-optic Kerr effect (MOKE) imaging system with a charge-coupled-device (CCD) camera by using the rotating compensator technique. We chose optimal conditions of the rotation frequency of the compensator with stable rotation along with a CCD camera frame rate that allowed precise control of the exposure timing in order to link with the angle of the compensator. Precise timing management of the CCD exposure enables us to carry out repeated experiments, which greatly improves the signal-to-noise ratio of the longitudinal MOKE signal. We applied the technique to the material characterization of the Ni81 Fe19 thin film and its microstructure, and succeeded in evaluating the spatial variation of the complex magneto-optic constant Q of the sample. Because of its attractive advantages such as high-speed and compactness, the present method provides a novel platform for investigating the domain structures in various magnetic materials.

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Section: Methodsmentioning

confidence: 99%

Magneto-optic Kerr effect CCD imaging with polarization modulation technique

et al. 2017

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“…The photodiode voltage was observed on an oscilloscope and transferred to a computer for analysis. The photodiode signals were evaluated to obtain the polarization in terms of the Stokes vector components [25]. The polarization states are calculated as Stokes vectors and presented graphically in either 2D or 3D projections of the Stokes vector space.…”

Section: Methodsmentioning

confidence: 99%

Ellipsometry with randomly varying polarization states

Liu¹,

Lee²,

Chen³

et al. 2012

Opt. Express

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Abstract:We show that, under the right conditions, one can make highly accurate polarization-based measurements without knowing the absolute polarization state of the probing light field. It is shown that light, passed through a randomly varying birefringent material has a well-defined orbit on the Poincar sphere, which we term a generalized polarization state, that is preserved. Changes to the generalized polarization state can then be used in place of the absolute polarization states that make up the generalized state, to measure the change in polarization due to a sample under investigation. We illustrate the usefulness of this analysis approach by demonstrating fiber-based ellipsometry, where the polarization state of the probe light is unknown, and, yet, the ellipsometric angles of the investigated sample (Ψ and Δ) are obtained with an accuracy comparable to that of conventional ellipsometry instruments by measuring changes to the generalized polarization state. 373-376 (2000). 6. K. Prime and G. Whitesides, "Self-assembled organic monolayers -model systems for studying adsorption of proteins At surfaces," Science 252(5009), 1164-1167 (1991). 7. J. Xue, C. Jung, and M. Kim, "Phase-transitions Of liquid-crystal films on an air-water-interface," Phys. Rev.Lett. 69(3), 474-477 (1992). 8. G. Rikken and E. Raupach, "Observation of magneto-chiral dichroism," Nature 390(6659), 493-494 (1997). 9. A. H. Gnauck, G. Charlet, P. Tran, P. J. Winzer, C. R. Doerr, J. C. Centanni, E. C. Burrows, T. Kawanishi, T. Sakamoto, and K. Higuma, "25.6-Tb/s WDM transmission of polarization-multiplexed RZ-DQPSK signals,"

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“…The light intensity changes by the rotation of compensator, whose azimuth is C, is expressed by sinusoidal function as [29,30], Figure 12. Typical SEM micrograph of particles suspended in plasma for 3 h.…”

Section: Experimental Setup For Imaging Mie-scattering Ellipsometrymentioning

confidence: 99%

Mie-Scattering Ellipsometry

Hayashi¹,

Sanpei²

2017

Ellipsometry - Principles and Techniques for Materials Characterization

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The size and refractive index of particles can be analyzed through the measurement of polarization state of scattered light. The change of polarization state in Mie scattering has been represented by ellipsometric parameters, Ψ and Δ, like the reflection ellipsometry. The analysis method is called Mie-scattering ellipsometry. By in-process Miescattering ellipsometry, the growth processes of carbon particles in argon plasma and in methane plasma were analyzed. It was found that carbon particles grow by coagulation in argon plasma, while they grow by carbon coating in methane plasma. It is also shown that imaging Mie-scattering ellipsometry has the potential for the easier confirmation of optical adjustment from a long distance, as well as for the analysis of spatial distribution of particle size.

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A rotating-compensator fourier ellipsometer

Cited by 102 publications

References 11 publications

Magneto-optic Kerr effect CCD imaging with polarization modulation technique

Magneto-optic Kerr effect CCD imaging with polarization modulation technique

Ellipsometry with randomly varying polarization states

Mie-Scattering Ellipsometry

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