2014
DOI: 10.1109/temc.2013.2296599
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A Rigorous Approach for the Radiated Emission Characterization Based on the Spherical Magnetic Field Scanning

Abstract: Electromagnetic radiated emissions from antennas, printed circuit boards (PCBs), and electronic devices are becoming increasingly critical to today's IC electromagnetic compatibility and interference properties. In this paper, a rigorous characterization approach is proposed. The electromagnetic field sampling over a spherical testing surface is applied to obtain the radiated magnetic field of the device under test (DUT) placed at the center of the sampling region. Using the dyadic Green's function (DGF) and H… Show more

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Cited by 12 publications
(1 citation statement)
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“…The continuous development of EMI source localization benefits from the uninterrupted improvement of electromagnetic radiation source reconstruction theory. From the original Huygens principle to the present, various radiation source reconstruction methods such as equivalent Huygens source [1][2][3][4] and equivalent dipole moment model [5][6][7][8][9] have been derived. The realization Supported by Beijing Natural Science Foundation.…”
Section: Introductionmentioning
confidence: 99%
“…The continuous development of EMI source localization benefits from the uninterrupted improvement of electromagnetic radiation source reconstruction theory. From the original Huygens principle to the present, various radiation source reconstruction methods such as equivalent Huygens source [1][2][3][4] and equivalent dipole moment model [5][6][7][8][9] have been derived. The realization Supported by Beijing Natural Science Foundation.…”
Section: Introductionmentioning
confidence: 99%