Research on a Two-stage Plane Adaptive Sampling Algorithm for Near-field Scanning Acceleration

Abstract

As one of the most useful methods in electromagnetic interference (EMI) diagnosis, near-field (NF) scanning is widely used in electromagnetic compatibility (EMC) evaluation of complex devices under test (DUTs). In this paper, a two-stage plane adaptive sampling algorithm is proposed to reduce the acquisition time in the process of NF scanning and to make reconstruction of the radiation source more efficient. The sampling method is based on the region self-growth algorithm and the Voronoi subdivision principle, significantly reducing the number of NF samples in the stage of solving the radiation source model through uniform and non-uniform two-stage sampling. Two experiments were conducted to verify the correctness and effectiveness by comparing with the traditional uniform sampling method.