1997
DOI: 10.1080/10408349708052201
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A Review of Microwave Plasma Sources in Atomic Emission Spectrometry: Literature from 1985 to the Present

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Cited by 34 publications
(8 citation statements)
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“…Pb alternatively used in analysis of environmental samples [29]. The MIP-OES measurements accuracy was good in comparison with the results obtained (Table 2) by independent techniques XRF and FAAS (the mean value of accuracy obtained from 5 independent analyses).…”
Section: Mean (%)mentioning
confidence: 92%
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“…Pb alternatively used in analysis of environmental samples [29]. The MIP-OES measurements accuracy was good in comparison with the results obtained (Table 2) by independent techniques XRF and FAAS (the mean value of accuracy obtained from 5 independent analyses).…”
Section: Mean (%)mentioning
confidence: 92%
“…The following parameters were defined: detection limits (defined follow 3 sigma criteria, where sigma is a standard deviation of series of 6 replicates of a blank) and limits of quantification (6 sigma criteria), range of calibration using non-linear algorithm provides a least second order least squares line of best fit in the intensity vs. concentration domain, and instrumental precision of determinations ( Table 2). The obtained values of parameters characterising the analytical method showed a real possibility to apply MIP-OES technique in the determinations of elements content in the extracts of environmental samples [29]. Additionally, the uncertainty of the whole analytical procedure (including sample preparation step), involving the repetition of the extraction cycle and measurement of elements content, assuming the values below 20% (that was mainly produced by the sample preparation stage), confirms the possibility to apply the described procedure in the studies of element content in Table 2 The optimised parameters and figures of merit for metals determination by MIP-OES (n¼ 6).…”
Section: The Position Of Plasma Observationmentioning
confidence: 97%
“…Except the high chemical reactivity, thermal plasmas exhibit very intense heat that is sufficient to melt and even vaporize most materials. They are often used in high-temperature materials-processing applications such as melting of metals, ceramics sintering and evaporation, and as an ionization sources in chemical analysis such as atomic emission spectroscopy [34,35] and mass spectrometry (MS). [36,37] …”
Section: à3mentioning
confidence: 99%
“…They found that when the excitation energy of the Ar II lines was less than the internal energy of the helium metastable states, the intensity of the Ar II lines were significantly increased, while in contrast, they found a reduction in emission intensity when the excitation energy exceeded the He metastable state. Helium has also been used and studied in microwave-induced plasmas [26][27][28][29][30][31]. As an example, Clay and Niemczyk have studied the effects of metastable energy transfer for metastable nitrogen, and reported that at nitrogen concentrations above 3%, the influence of metastable nitrogen is quite significant [26].…”
Section: Introductionmentioning
confidence: 97%