2006
DOI: 10.1109/jssc.2005.857357
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A Quadrature Charge-Domain Sampler With Embedded FIR and IIR Filtering Functions

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Cited by 33 publications
(20 citation statements)
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“…10). Therefore, we find the DT differential output noise PSD as (18) Since the absolute value of four input sources are the same, (18) can be simplified as (19) and by substituting , the differential output noise PSD is simplified to (20). (See equation at the bottom of the page.)…”
Section: B Dt Cs-bpf Noise Modelmentioning
confidence: 99%
See 2 more Smart Citations
“…10). Therefore, we find the DT differential output noise PSD as (18) Since the absolute value of four input sources are the same, (18) can be simplified as (19) and by substituting , the differential output noise PSD is simplified to (20). (See equation at the bottom of the page.)…”
Section: B Dt Cs-bpf Noise Modelmentioning
confidence: 99%
“…7 can be calculated based on the same approach; DT noise PSD derived in (20). We find the total CT differential output noise PSD as It should be pointed out that integrating the DT differential output noise PSD in (20) over 0-toyields , with being the total differential output capacitance equal to . On the other hand, integrating the CT noise PSD in (21) over the entire range of 0 to is again equal to , with .…”
Section: B Dt Cs-bpf Noise Modelmentioning
confidence: 99%
See 1 more Smart Citation
“…To lay the foundation in those lines, we propose a charge sampling architecture as an ultrasound analog front-end. Recently, charge sampling has been demonstrated as an attractive alternative compared to the usual well known voltage sampling in high speed applications, even with low supply voltages [19][20][21][22][23][24]. Charge sampling has also been proved to have better immunity to clock jitter for certain ranges of input signal frequency [25][26][27] and better performance at high speed and low voltage operation compared to voltage sampling [19][20][21][22][23][24].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, charge sampling has been demonstrated as an attractive alternative compared to the usual well known voltage sampling in high speed applications, even with low supply voltages [19][20][21][22][23][24]. Charge sampling has also been proved to have better immunity to clock jitter for certain ranges of input signal frequency [25][26][27] and better performance at high speed and low voltage operation compared to voltage sampling [19][20][21][22][23][24]. Although high speed charge integrating mode architectures [23,28,29] have been reported, these were not used as ultrasound front-ends and also were not designed in stateof-the-art deep submicron technologies.…”
Section: Introductionmentioning
confidence: 99%