42nd ARFTG Conference Digest 1993
DOI: 10.1109/arftg.1993.327043
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A Pulse Bias/RF Environment for Device Characterization

Barry E. Taylor
1
,
Mohamed Sayed
2
,
Kevin Kerwin
3
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Cited by 7 publications
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Nonlinear characterization and modeling of dispersive effects in high-frequency power transistors

Jardel1,
Sommet2,
Teyssier3
et al. 2011
Nonlinear Transistor Model Parameter Extraction Techniques
3
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Nonlinear characterization and modeling of dispersive effects in high-frequency power transistors

Jardel1,
Sommet2,
Teyssier3
et al. 2011
Nonlinear Transistor Model Parameter Extraction Techniques
3
0
0
0
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Pulsed device measurements and applications

Scott
1
,
Rathmell
2
,
Parker
3
et al. 1996
IEEE Trans. Microwave Theory Techn.
56
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16
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A low-cost pulsed RF & I-V measurement setup for isothermal device characterization

Marchetti
1
,
Buisman
2
,
Pelk
3
et al. 2007
2007 70th ARFTG Microwave Measurement Conference (ARFTG)
4
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