2010
DOI: 10.2116/analsci.26.331
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A Procedure for the Improvement in the Determination of a TXRF Spectrometer Sensitivity Curve

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Cited by 13 publications
(7 citation statements)
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“…This sensitivity is different for each element and mainly depends on the fundamental parameters (σ i and ω i ) and the conditions of measurement (K i ) that generally can be supposed as constant. Generally, this curve is obtained measuring certificated multielement samples and in recent works, measuring this answer when analyzing the relative intensities of known stoichiometry compounds 29 In summary, the conversion of the intensity measured I i into the unknown concentration C i of the element i is obtained from Eq. (2), as:…”
Section: Fig 1: Structure Of the Cianocobalamine Moleculementioning
confidence: 99%
See 1 more Smart Citation
“…This sensitivity is different for each element and mainly depends on the fundamental parameters (σ i and ω i ) and the conditions of measurement (K i ) that generally can be supposed as constant. Generally, this curve is obtained measuring certificated multielement samples and in recent works, measuring this answer when analyzing the relative intensities of known stoichiometry compounds 29 In summary, the conversion of the intensity measured I i into the unknown concentration C i of the element i is obtained from Eq. (2), as:…”
Section: Fig 1: Structure Of the Cianocobalamine Moleculementioning
confidence: 99%
“…Galium was added as internal standard in these solutions with a constant concentration of 5 μg/mL. The TXRF spectra of these standards were measured for 500 s and the relative sensitivities with respect to Ga were determined, as is described in our previous studies 29,30 .…”
Section: Fig 1: Structure Of the Cianocobalamine Moleculementioning
confidence: 99%
“…The amount of low- Z elements was determined by the addition of the Sc internal standard. Bennun and Sanhueza reported that chemical compounds of stoichiometric compositions and high purity, including at least two elements such as K and Mn in KMnO 4 , could be used for alternative materials of certified standard materials in quantitative TXRF analysis.…”
Section: Total Reflection X-ray Fluorescence Analysismentioning
confidence: 99%
“…Evaluating the trace metal composition and the metals' effects in these media require sensitive techniques that can quantify the typically low concentration levels of metals in these media, over a wide range of particle sizes. Studies have shown that although ICP-MS (inductively coupled plasma mass spectrometry), ICP-OES (inductively coupled plasma optical emission spectroscopy), and AAS (atomic absorption spectroscopy) are sensitive techniques, most often a larger amount of sample substance is necessary for adequate sample preparation and handling (Bennun and Sanhueza, 2010). This makes the application of alternative techniques such as total reflection X-ray fluorescence spectrometry (TXRF) attractive in the analysis of particulate matter with very little mass, (typically in the microgram range) in comparison to the other techniques (Bulska and Ruszczyńska, 2017).…”
Section: Introductionmentioning
confidence: 99%