A poly-Si defect-tolerant scanner for large area AMLCDs

Asada, Hideki; Hayama, Hiroshi; Saito, Tetsuya; Sera, K.; Okumura, F.

doi:10.1109/isscc.1993.280049

Cited by 2 publications

(2 citation statements)

References 5 publications

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“…As a part of these studies, researches such as flexible electrodes [4]- [6], substrate [7], [8], thin film transistor (TFT) [9]- [11], and materials [12] have been conducted. In 1992 and 1993, there were studies on faulttolerant technology for display applications [13], [14], but the studies have not been cited so far. Recently, however, as the research on flexible displays has just started, the need for related research is emerging.…”

Section: Introductionmentioning

confidence: 99%

Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

Kim

Lee

et al. 2019

IEEE J. Electron Devices Soc.

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This paper presents automatic fault detection circuit for integrated gate drivers. The proposed circuit consists of one capacitor and two TFTs per scan line. The circuit can detect three types of faults, such as line disconnection (LD), low voltage stuck (LVS), and high voltage stuck (HVS) for the gate driver due to external physical stress. Simulation results showed the proposed circuit operates well. In order to verify the circuit operation, it was fabricated with indium gallium zinc oxide thin film transistors process. The measurement results also verified that our proposed fault detection circuit could detect the types and locations of the LD and LVS of the gate driver successfully. However, we found that HVS can be detected, but further study is needed to accurately detect the position of HVS in the proposed circuit.INDEX TERMS Fault detection, stretchable display, gate driver circuits.

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Section: Introductionmentioning

confidence: 99%

Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

Kim

Lee

et al. 2019

IEEE J. Electron Devices Soc.

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“…As a result, it helps lifetime improvement of the system. FT technologies for display applications were studied in the past [13], [14]. They adopt redundant circuits commonly used for FT architecture.…”

Section: Introductionmentioning

confidence: 99%

Fault-Tolerant Architecture for Reliable Integrated Gate Drivers

Kim

Chung

Lee

2019

IEEE J. Electron Devices Soc.

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This paper proposes fault-tolerant (FT) architecture for integrated gate drivers. It can automatically detect faults in the gate driver caused by external physical stress and then immediately repair them as well. As a result, it can contribute to highly reliable display products. The proposed architecture uses redundant circuit structure with fault detection circuit. The detailed algorithm for the proposed method is presented in this paper. Simulation and measurement results verify that the proposed circuit and its driving algorithm operates successfully. Finally, the display system architecture is also suggested for realization of our FT method.INDEX TERMS Fault tolerance, flexible displays, integrated gate drivers.

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A poly-Si defect-tolerant scanner for large area AMLCDs

Cited by 2 publications

References 5 publications

Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

Fault-Tolerant Architecture for Reliable Integrated Gate Drivers

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