2020
DOI: 10.1007/s11664-019-07927-8
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A Physics-Based Compact Static and Dynamic Characteristics Model for Al2O3/InxAl1−xN/AlN/GaN MOS-HEMTs

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Cited by 5 publications
(2 citation statements)
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“…In Fig. 6 the capacitance is varying gradually with an increase in drain voltage, when the device becomes saturated, so that the drain voltage can affect the charge in the channel [2].…”
Section: Resultsmentioning
confidence: 99%
“…In Fig. 6 the capacitance is varying gradually with an increase in drain voltage, when the device becomes saturated, so that the drain voltage can affect the charge in the channel [2].…”
Section: Resultsmentioning
confidence: 99%
“…TABLE I: Constant terms obtain from integration (25) with reference to [23], [35] Constant Expression…”
Section: B 2-deg Sheet Charge Carrier Density Modelmentioning
confidence: 99%