2016
DOI: 10.1016/j.measurement.2015.11.019
|View full text |Cite
|
Sign up to set email alerts
|

A novel surface recovery algorithm in white light interferometry

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
24
0

Year Published

2018
2018
2025
2025

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 45 publications
(24 citation statements)
references
References 30 publications
0
24
0
Order By: Relevance
“…Fringe analysis algorithms are essential for optical interferometric measurements to effectively reconstruct the surface topography. Even though a variety of fringe analysis algorithms have been developed over a wide range of application areas [33,[99][100][101], the performance of an algorithm is affected by many factors [102]. The selection of an appropriate fringe analysis algorithm needs trade-off considerations because the desired measurement accuracy, speed, resolution, and robustness vary depending on the algorithms [103].…”
Section: Theory Of Fringe Analysis Algorithmsmentioning
confidence: 99%
“…Fringe analysis algorithms are essential for optical interferometric measurements to effectively reconstruct the surface topography. Even though a variety of fringe analysis algorithms have been developed over a wide range of application areas [33,[99][100][101], the performance of an algorithm is affected by many factors [102]. The selection of an appropriate fringe analysis algorithm needs trade-off considerations because the desired measurement accuracy, speed, resolution, and robustness vary depending on the algorithms [103].…”
Section: Theory Of Fringe Analysis Algorithmsmentioning
confidence: 99%
“…The Hilbert transform (HT) is an alternative method to obtain coherence envelope and phase values from the captured interference signals [ 24 , 25 , 26 ]. This method effectively reduces the computational complexity and allows a faster processing speed for real-time imaging [ 27 ].…”
Section: Introductionmentioning
confidence: 99%
“…Most of the optical probes couldn’t fulfil the requirement of high accuracy, due to the fact that their measuring accuracy could be easily influenced by the surface or the material of the measured piece, and the pixels of the image processing instrument were also limited. High resolution could be also obtained by confocal sensor [10], quadrant photo detector [11], Fizeau interferometer [12], white light interference [13,14,15] and other complex photoelectric sensing technology in the probe design. However, the assembly of these sensors is costly and the volume of the assembled probes are usually bulky, which is not suitable for the measurement of micro devices.…”
Section: Introductionmentioning
confidence: 99%