A novel readout circuit for on-sensor multispectral classification

Abstract

A new readout integrated circuit (ROIC) for multispectral classification is presented. The ROIC is designed to utilize the spectral response tunability of dot-in-a-well (DWELL) infrared photodetector to exploit the possibility of real-time onchip multispectral imaging for classification in analog domain. The unit cells are designed to include all necessary elements needed for spectral classification, including high-voltage timevarying positive and negative biases, bipolar integration, and selective sample-and-hold circuits. A test chip was designed and fabricated using TSMC's 0.35 μm high-voltage technology. The test chip has successfully completed its initial functional tests and is ready for hybridization to a DWELL focal-plane array.