2001
DOI: 10.1080/09500830010017088
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A novel method for constructing the mean field of grain-orientation-dependent residual stress

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Cited by 41 publications
(30 citation statements)
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“…In a diffraction experiment, a shift in a diffraction peak under load corresponds to a lattice strain measurement of a subset of crystals within the polycrystal with a particular {h k l} crystallographic plane normal aligned with a particular specimen direction. Combining the lattice strain data from a broad suite of {h k l} reflections gives sufficient information to determine the lattice strain tensor as a function of lattice orientation [7,8]. Often only a few {h k l} reflections are examined, and while these are insufficient to reconstruct the full, orientation-dependent strain tensor, the data nevertheless are useful in understanding the behaviors at the crystal scale.…”
Section: Introductionmentioning
confidence: 99%
“…In a diffraction experiment, a shift in a diffraction peak under load corresponds to a lattice strain measurement of a subset of crystals within the polycrystal with a particular {h k l} crystallographic plane normal aligned with a particular specimen direction. Combining the lattice strain data from a broad suite of {h k l} reflections gives sufficient information to determine the lattice strain tensor as a function of lattice orientation [7,8]. Often only a few {h k l} reflections are examined, and while these are insufficient to reconstruct the full, orientation-dependent strain tensor, the data nevertheless are useful in understanding the behaviors at the crystal scale.…”
Section: Introductionmentioning
confidence: 99%
“…These can, respectively, be taken as resistance to elastic and plastic deformation. As shown in To expand the picture of heterogeneous deformation further, residual stress values were measured for different goniometer angles and for the respective poles of (0 0 0 4), ð0 1 1 4Þ, ð0 1 1 5Þ and ð1 1 2 4Þ in an Eulerian texture cradle [16,[20][21][22]. In general, near basal orientations had more residual stress (five times or more) and Figure 6 plots the compressive residual stress distribution in the / 2 = 0°section.…”
mentioning
confidence: 99%
“…Penetration through moderate thicknesses (mm-cm) of metallic samples combined with the advantages of high speed area detectors and short collection times have enabled a new generation of high energy synchrotron x-ray diffraction experiments [34], [48], [30], [49], [13], [33], [23], [5]. This large number of lattice strain measurements can be assembled into lattice strain pole figures [15], [46], [36], [33], which can be "inverted" to calculate the orientation-dependent strain and stress tensors within the polycrystalline diffraction volume [3], [47], [6]. The strain pole figure inversion method, which was employed in McNelis et al [31] and is consistent with the method developed by Bernier et al [6] for in situ loading experiments, is used in this work to make the connection between the measured lattice strains and the stress distribution over all crystal orientations within each diffraction volume.…”
Section: Diffraction Methods For Determining Residual Stressmentioning
confidence: 99%