1992
DOI: 10.1002/mop.4650050305
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A novel mesfet‐compatible gaas optoelectronic switch

Abstract: Photoconductive optoelectronic pulse‐forming switches have been fabricated from vapor‐phase epitaxially grown GaAs‐based layer structures. The fabrication process is compatible with the MESFET/MMIC technology. The light‐absorbing region is thinned by chemical etching, thus changing the actual carrier lifetime in this region. The switches showed off/on resistance ratios of about 500 even at about 0.1‐mW incident optical power. The pulse response of the devices is limited by the lifetime of charge carriers.

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Cited by 5 publications
(2 citation statements)
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“…However, in samples A and B, β approaches even -0.3, indicating a trap-assisted gain. The traps also caused a long tail in the pulse response of our devices [3]. The correlation with dark current is worth noting: the traps that cause the ,Q N -0.3 values, decrease also the dark current by trapping mobile carriers.…”
mentioning
confidence: 59%
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“…However, in samples A and B, β approaches even -0.3, indicating a trap-assisted gain. The traps also caused a long tail in the pulse response of our devices [3]. The correlation with dark current is worth noting: the traps that cause the ,Q N -0.3 values, decrease also the dark current by trapping mobile carriers.…”
mentioning
confidence: 59%
“…In this work, we report on the gain behavior of GaAs photoconductors realized on partly compensated material. The device is essentially a gateless MESFET, where the channel and a part of the buffer layer is removed by chemical etching [3]. The layer structure consists of a 3 pm nominally undoped buffer layer and a 0.3 pm n-type layer doped to 4 x 10 17 cm-3, all grown by vapor-phase epitaxy (VPE).…”
mentioning
confidence: 99%