A Novel Frictional Force Microscope with 3-Dimensional Force Detection

Dienwiebel, Martin; Heimberg, J. A.; Zijlstra, T.; Drift, E. van der; Spaanderman, Dirk-Jan; Kuyper, E. de; Frenken, J.W.M.

doi:10.1007/978-1-4615-1023-9_11

Cited by 4 publications

(8 citation statements)

References 9 publications

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“…9b. From the data, the angular dependence of vertical displacement 3 u , is smoother, more isotropic, and much more convex than the one for 33 e . The maximum value of 3 u corresponds to the polar direction 0 = θ , whereas 33 e reaches the maximum for 0 ≠ θ .…”

Section: Iv1 Orientation Dependencementioning

confidence: 81%

“…From the data, the angular dependence of vertical displacement 3 u , is smoother, more isotropic, and much more convex than the one for 33 e . The maximum value of 3 u corresponds to the polar direction 0 = θ , whereas 33 e reaches the maximum for 0 ≠ θ . The dependence of the piezoelectric tensor component 35 e vs. the orientation of the crystallographic axes with respect to the laboratory coordinate system for a LiTaO 3 crystal is shown in Fig.…”

Section: Iv1 Orientation Dependencementioning

confidence: 81%

“…30 , 31 A number of attempts to develop 3D force sensors avoiding this limitation have been reported. 32,33 In the continuum mechanics limit, the contact stiffnesses are proportional to contact radius, 1 a a ij . This behavior holds down to length scales of a few atoms.…”

Section: Stm Afm Pfmmentioning

confidence: 99%

“…Here, we analyze the applicability of Eqs. The dependence of the piezoelectric tensor component 33 e vs. the orientation of the crystallographic axes with respect to the laboratory coordinate system for LiTaO 3 crystal is shown in Fig. 9a.…”

Section: Iv1 Orientation Dependencementioning

confidence: 99%

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Electromechanical detection in scanning probe microscopy: Tip models and materials contrast

Eliseev

Kalinin

Jesse

et al. 2007

Journal of Applied Physics

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The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical, and electromechanical behavior on the nanoscale. Here, we analyze the general principles of electromechanical probing by piezoresponse force microscopy (PFM), a scanning probe technique applicable to a broad range of piezoelectric and ferroelectric materials. The physics of image formation in PFM is compared to Scanning Tunneling Microscopy and Atomic Force Microscopy in terms of the tensorial nature of excitation and the detection signals and signal dependence on the tipsurface contact area. It is shown that its insensitivity to contact area, capability for vector detection, and strong orientational dependence render this technique a distinct class of SPM.The relationship between vertical and lateral PFM signals and material properties are derived analytically for two cases: transversally-isotropic piezoelectric materials in the limit of weak elastic anisotropy, and anisotropic piezoelectric materials in the limit of weak elastic and dielectric anisotropies. The integral representations for PFM response for fully anisotropic material are also obtained. The image formation mechanism for conventional (e.g., sphere and cone) and multipole tips corresponding to emerging shielded and strip-line type probes are analyzed. Resolution limits in PFM and possible applications for orientation imaging on the nanoscale and molecular resolution imaging are discussed.

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Section: Iv1 Orientation Dependencementioning

confidence: 81%

Section: Iv1 Orientation Dependencementioning

confidence: 81%

Section: Stm Afm Pfmmentioning

confidence: 99%

Section: Iv1 Orientation Dependencementioning

confidence: 99%

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Electromechanical detection in scanning probe microscopy: Tip models and materials contrast

Eliseev

Kalinin

Jesse

et al. 2007

Journal of Applied Physics

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“…Therefore, unambiguous measurement of all three components of the electromechanical response vector requires alternative solutions, e.g., based on either 3D SPM 78 or sample rotation. 65,66 At the same time, electromechanical, local, and non-local contributions to the PFM signal are additive, making it possible to distinguish the relative contributions of these signals to the observed contrast.…”

Section: Iii31 Cantilever Dynamicsmentioning

confidence: 99%

A decade of piezoresponse force microscopy: progress, challenges, and opportunities

Kalinin

Rar²,

Jesse

2006

IEEE Trans. Ultrason., Ferroelect., Freq. Contr.

183

130

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Coupling between electrical and mechanical phenomena is a near-universal characteristic of inorganic and biological systems alike, with examples ranging from ferroelectric perovskites to electromotor proteins in cellular membranes. Understanding electromechanical functionality in materials such as ferroelectric nanocrystals, thin films, relaxor ferroelectrics, and biosystems requires probing these properties on the nanometer level of individual grain, domain, or protein fibril. In the last decade, Piezoresponse Force M icroscopy (PFM ) was established a powerful tool for nanoscale imaging, spectroscopy, and manipulation of ferroelectric and piezoelectric materials. Here, we present principles and recent advances in PFM , including vector and frequency dependent imaging of piezoelectric materials, briefly review applications for ferroelectric materials, discuss prospects for electromechanical imaging of local crystallographic and molecular orientations and disorder, and summarize future challenges and opportunities for PFM emerging in the second decade since its invention. * Corresponding author, sergei2@ornl.gov 2

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