A novel field cage design for the CPS IPM and systematic errors in beam size and emittance

Satou, Kenichirou; Storey, J. W.; Levasseur, Swann; Schneider, Gerhard; Bodart, D; Sapinski, Mariusz

doi:10.1088/1742-6596/1067/7/072008

Cited by 1 publication

(3 citation statements)

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“…Measured profiles are normalized to unit integral. 4. Measured profile bins are set to zero for values smaller than 5% of the peak value.…”

Section: Hyper-parameter Rangementioning

confidence: 99%

“…Because of their lower mass, electrons are removed much faster from the influence of bunch fields, however the effect of these fields on their trajectories is proportionally larger. Usually ion-based devices are preferred due to simpler assembly (no need of ion-trapping [4]), smaller impact of fringe fields of neighbouring magnets and lack of background signal from electrons generated from various other sources [5]. However the influence of beam fields plays a major role for high-brightness beams and thus electron-based IPMs are preferred over ion-based devices, mainly because the electron movement can be easily confined to small gyroradius by applying external magnetic field.…”

Section: Introductionmentioning

confidence: 99%

“…Also if the guiding fields are not perfectly aligned with respect to each other this introduces an additional disturbance. 4. Gas ionization from synchrotron radiation and the influence of wake fields on particle trajectories may constitute additional sources of profile distortion.…”

Section: Introductionmentioning

confidence: 99%

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Space-charge distortion of transverse profiles measured by electron-based ionization profile monitors and correction methods

Vilsmeier

Sapinski

Singh

2019

Phys. Rev. Accel. Beams

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Measurements of transverse profiles using Ionization Profile Monitors (IPMs) for high brightness beams are affected by the electromagnetic field of the beam. This interaction may cause a distortion of the measured profile shape despite strong external magnetic field applied to impose limits on the transverse movement of electrons. The mechanisms leading to this distortion are discussed in detail. The distortion itself is described by means of analytic calculations for simplified beam distributions and a full simulation model for realistic distributions. Simple relation for minimum magnetic field scaling with beam parameters for avoiding profile distortions is presented. Further, application of machine learning algorithms to the problem of reconstructing the actual beam profile from distorted measured profile is presented. The obtained results show good agreement for tests on simulation data. The performance of these algorithms indicate that they could be very useful for operations of IPMs on high brightness beams or IPMs with weak magnetic field.

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“…Measured profiles are normalized to unit integral. 4. Measured profile bins are set to zero for values smaller than 5% of the peak value.…”

Section: Hyper-parameter Rangementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Space-charge distortion of transverse profiles measured by electron-based ionization profile monitors and correction methods

Vilsmeier

Sapinski

Singh

2019

Phys. Rev. Accel. Beams

View full text Add to dashboard Cite

show abstract

A novel field cage design for the CPS IPM and systematic errors in beam size and emittance

Cited by 1 publication

References 2 publications

Space-charge distortion of transverse profiles measured by electron-based ionization profile monitors and correction methods

Space-charge distortion of transverse profiles measured by electron-based ionization profile monitors and correction methods

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