A novel experimental validation method of dynamic X-parameters includes long-term memory effects

Abstract

A novel experimental validation method for the modeling of amplifier with long-term memory effects of dynamic X-parameters is proposed in this paper. The basic idea of this method is by applying the narrow step signal as stimulus signal to replace the classical two-tone measurements. The comparison results between the measured and the measurement-based model have a perfect agreement, and it proves the validity of theory.Index Terms -Behavioral model, Dynamic X-parameters, long-term memory effects, narrow step signal.

Analysing the characteristics of the memory effects of mixers using two-tone measurements

“…Only MBBM model can characterise the memory effects of the mixers in these models. The dynamic X-parameter model [16,17,18,19] can characterise the memory effects of microwave components, but this model is only applied to characterise amplifiers' memory effects at present. Although the MBBM model accurately characterises mixers' memory effects, they cannot intuitively describe the changing characteristics of mixers' IM3 products versus tone spacing.…”