A new study of the refractive-index dispersion of Ag-photodoped thin films of As30S70 chalcogenide glass

Ramírez-Malo, J.B.; Márquez, E.; Corrales, C.; Fernández-Peña, J.; Reyes, J.; Villares, P.; Jiménez‐Garay, R.

doi:10.1016/0254-0584(95)01664-g

Cited by 5 publications

(2 citation statements)

References 7 publications

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“…The addition of silver into chalcogenide glasses leads to drastic changes in the physical and chemical properties of the materials [26,27]. For instance, in thin films from As x S(Se) 100−x systems (for x = 30, 33, 40 at%) large increases of about 0.4-0.7 in the refractive index were observed following Ag photo-dissolution [28][29][30][31]. This could be ascribable to the easily polarizable electron clouds of the silver atoms.…”

Section: Introductionmentioning

confidence: 99%

Structural and optical characterization of Ag photo-doped thin As₄₀S_{60 −x}Se_xfilms for non-linear applications

Tasseva

Todorov²,

Babeva

et al. 2010

J. Opt.

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This paper deals with the structure and the optical properties of thin As40S60 − xSex films doped with silver. The refractive index n and the optical band gap Egopt were calculated from the transmittance and reflectance spectra. The results showed that the photo-doping leads to increase in the refractive index by about 0.25–0.27. An effect of thickness expansion was observed in the photo-doped layers. The non-linear refractive index, γ, and the two-photon absorption coefficient, β, were evaluated by applying a formula developed by Sheik-Bahae. Each of the films studied exhibits a highly non-linear refractive index at the telecommunication wavelength, 70–850 times higher than that measured for fused silica. From the Raman spectra of thin As40S30Se30 it might be concluded that under dissolution, the silver interacts with both sulfur and selenium. The surface of the thin films was investigated by using a white light interferometric profiler. It was found that the increase in the thickness of the silver layer results in roughening of the surface of the photo-doped films.

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Section: Introductionmentioning

confidence: 99%

Structural and optical characterization of Ag photo-doped thin As₄₀S_{60 −x}Se_xfilms for non-linear applications

Tasseva

Todorov²,

Babeva

et al. 2010

J. Opt.

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“…It was found that the addition of silver into chalcogenide glasses leads to drastic changes in the physical and chemical properties of the materials [13,14]. Large increases of about 0.4-0.7 in the refractive index were observed following Ag photodissolution [15][16][17][18]. 1 Author to whom any correspondence should be addressed.…”

Section: Introductionmentioning

confidence: 99%

Spectral properties of the silver photodoping process in thin As–S–Se layers

Todorov¹,

Atanasova²,

Petkov³

et al. 2012

Semicond. Sci. Technol.

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This paper deals with the optical properties of thin chalcogenide films from the ternary As 33 S 67−x Se x system depending on the composition and conditions of illumination using various light sources (white light, monochromatic light with λ = 481, 514 (Ar + -laser) and 632.8 nm (He-Ne laser), respectively). The spectral dependence of the changes of the optical properties of thin As 33 S 67−x Se x layers with thickness d ∼ 150-190 nm doped with silver were investigated. The optical constants (refractive index, n and extinction coefficient, k) were calculated applying double TR methods using both measured transmittance, T and reflectance, R spectra. The optical constants of single layers from chalcogenide glass and from silver have been used to calculate the reflectance spectrum of the unexposed As-S-Se/Ag bilayer system. Applying Tauc's law, the optical band gap, E g and the structural parameter, B, related to the slope of the absorption edge, were determined.

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Refractive index change caused by electron irradiation in amorphous As–S and As–Se thin films coated with different metals

Nordman

2001

Journal of Applied Physics

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The refractive index change caused by electron irradiation was measured in amorphous As–S and As–Se thin films coated with different metals. Metal atoms/ions diffused into the films during irradiation. The diffusion was dependent on the metal and influenced the refractive index. The influence was smallest in As40S60 films although these films possessed the highest overall refractive index changes. Au atoms/ions were almost immobile in all films while Ag atoms/ions had the highest mobility. Their high mobility allowed them to diffuse laterally within the film.

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A new study of the refractive-index dispersion of Ag-photodoped thin films of As30S70 chalcogenide glass

Cited by 5 publications

References 7 publications

Structural and optical characterization of Ag photo-doped thin As₄₀S_{60 −x}Se_xfilms for non-linear applications

Structural and optical characterization of Ag photo-doped thin As₄₀S_{60 −x}Se_xfilms for non-linear applications

Spectral properties of the silver photodoping process in thin As–S–Se layers

Refractive index change caused by electron irradiation in amorphous As–S and As–Se thin films coated with different metals

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A new study of the refractive-index dispersion of Ag-photodoped thin films of As30S70 chalcogenide glass

Cited by 5 publications

References 7 publications

Structural and optical characterization of Ag photo-doped thin As40S60 −xSexfilms for non-linear applications

Structural and optical characterization of Ag photo-doped thin As40S60 −xSexfilms for non-linear applications

Spectral properties of the silver photodoping process in thin As–S–Se layers

Refractive index change caused by electron irradiation in amorphous As–S and As–Se thin films coated with different metals

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Structural and optical characterization of Ag photo-doped thin As₄₀S_{60 −x}Se_xfilms for non-linear applications

Structural and optical characterization of Ag photo-doped thin As₄₀S_{60 −x}Se_xfilms for non-linear applications