A new setup for high resolution fast X-ray reflectivity data acquisition

Buffet, Adeline; Pflaum, K.; Ehnes, A.; Ciobanu, A.; Seeck, O. H.

doi:10.1063/1.4967239

Cited by 10 publications

(11 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Lippmann and co-workers [22] use a fast rotating, slightly tilted sample reflecting to a stationary mounted position sensitive detector.The shortest measurements, covering momentum transfer values up to 0.55Å −1 , are 2 s or less, even down to a quarter of a second. While the spatial resolution mainly depends on the beam properties and the detector pixel size, the shortest achievable acquisition time depends on the speed of the rotation table, the photon flux, and the sample detector distance.…”

Section: Technique Developmentsmentioning

confidence: 99%

Recent developments in the application of X-ray and neutron reflectivity to soft-matter systems

Skoda

2019

Current Opinion in Colloid & Interface Science

View full text Add to dashboard Cite

Many interesting physical, chemical and biological phenomena occur at interfaces between nanometre scale layers of soft condensed matter. Theses often complex systems lend themselves to study by X-ray (XRR) and neutron reflectivity (NR). The application of these techniques to such systems is extremely wide spread and provides unique insights into their structure and dynamics. This review presents a snapshot of recent activity in this research area and identifies trends in the application of XRR and NR to novel, unusual or highly complex sample systems. Although the majority of research using these techniques is investigating variations on 'traditional' systems, supported by progress in instrumentation, advance sample environment and computational tools, NR and XRR have begun to produce singular insights in areas such as atmospheric science, real biological systems (cells and bacteria), oil-water interfaces or industrial problems (rheology, packaging or durability of nano-materials).

show abstract

Section: Technique Developmentsmentioning

confidence: 99%

Recent developments in the application of X-ray and neutron reflectivity to soft-matter systems

Skoda

2019

Current Opinion in Colloid & Interface Science

View full text Add to dashboard Cite

show abstract

“…116) One way to surmount the limitation is to employ the energy-dispersive mode using a polychromatic beam and an energy-sensitive X-ray detector. 117) Equivalent measurements with no motor rotation have been achieved by the simultaneous multiwavelength dispersive technique using a curved crystal polychromator installed on a synchrotron beamline where a white X-ray beam is available.…”

Section: High-speed Measurementmentioning

confidence: 99%

In situ synchrotron X-ray diffraction study on epitaxial-growth dynamics of III–V semiconductors

Takahasi

2018

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

The application of in situ synchrotron X-ray diffraction (XRD) to the molecular-beam epitaxial (MBE) growth of III-V semiconductors is overviewed along with backgrounds of the diffraction theory and instrumentation. X-rays are sensitive not only to the surface of growing films but also to buried interfacial structures because of their large penetration depth. Moreover, a spatial coherence length up to µm order makes X-rays widely applicable to the characterization of low-dimensional structures, such as quantum dots and wires. In situ XRD studies during growth were performed using an X-ray diffractometer, which was combined with an MBE chamber. X-ray reciprocal space mapping at a speed matching a typical growth rate was achieved using intense X-rays available from a synchrotron light source and an area detector. The importance of measuring the three-dimensional distribution of XRD intensity in a reciprocal space map is demonstrated for the MBE growth of two-, one-, and zero-dimensional structures. A large amount of information about the growth process of two-dimensional InGaAs/GaAs(001) epitaxial films has been provided by three-dimensional X-ray reciprocal mappings, including the anisotropic strain relaxation, the compositional inhomogeneity, and the evolution of surface and interfacial roughness. For one-dimensional GaAs nanowires grown in a Au-catalyzed vapor-liquid-solid mode, the relationship between the diameter of the nanowires and the formation of polytypes has been suggested on the basis of in situ XRD measurements. In situ three-dimensional X-ray reciprocal space mapping is also shown to be useful for determining the lateral and vertical sizes of self-assembled InAs/GaAs(001) quantum dots as well as their internal strain distributions during growth.

show abstract

“…In the last years, a range of fast XRR techniques have been developed that can acquire XRR curves on timescales as low as 100 ms (Joress et al, 2018;Lippmann et al, 2016;Mocuta et al, 2018), posing challenges to the data handling if on-line monitoring is required. Some of these methods employ energy-dispersive measurements (Kowarik et al, 2007;Metzger et al, 1994;Mukherjee et al, 2002), which are also used in neutron reflectometry (Cubitt et al, 2018).…”

Section: Introductionmentioning

confidence: 99%