1991
DOI: 10.1557/proc-219-303
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A New Self-Aligned A-SI TFT Using Ion Doping and Chromium Silicide Formation

Abstract: A new self-aligned a-Si TFT has been developed. Ion doping and chromium silicide (CrSix) formation technique was used to fabricate source and drain, which are self-aligned to the gate electrode, instead of using the previously reported lift-off process. The fabricated TFT mobility is about 0.5cm2/V' sec and threshold voltage is about 3V. The ON/OFF ratio is over 106. The actions of as short as 2μm channel TFT have been confirmed, using a large area TFT process. These results show that this technique can be app… Show more

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Cited by 13 publications
(1 citation statement)
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“…Bottom gate, inverted-staggered, self-aligned TFT's have been reported using lift-off [1], ion-implantation and silicidation [2]- [4], backside laser recrystallization [5], and frontside laser doping [6]. No top gate, staggered, self-aligned TFT process has yet been reported, although coplanar top gate test TFT's, which give isolated TFT's without cross-overs, have been reported by ion implantation and silicidation [7] and by frontside laser recrystallization [8].…”
mentioning
confidence: 99%
“…Bottom gate, inverted-staggered, self-aligned TFT's have been reported using lift-off [1], ion-implantation and silicidation [2]- [4], backside laser recrystallization [5], and frontside laser doping [6]. No top gate, staggered, self-aligned TFT process has yet been reported, although coplanar top gate test TFT's, which give isolated TFT's without cross-overs, have been reported by ion implantation and silicidation [7] and by frontside laser recrystallization [8].…”
mentioning
confidence: 99%