A new scanning mode to improve scanning ion conductance microscopy imaging rate with pipette predicted movement

Zhuang, Jian; Jiao, Yangbohan; Mugabo, Vincent

doi:10.1016/j.micron.2017.07.007

Cited by 18 publications

(13 citation statements)

References 23 publications

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“…94 The retract distance employed is a limiting factor on SICM scan times, and so methods that reduce this are advantageous. Recently, SICM feedback control during the lateral movement across the sample has been considered, 130 which allows smaller retract distances to be used.…”

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confidence: 99%

Nanoscale Electrochemical Mapping

et al. 2018

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confidence: 99%

Nanoscale Electrochemical Mapping

et al. 2018

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“…To highlight the performance of SICM in the TFSM, the TFSM and the conventional hopping mode measurements were repeated ten times on the PDMS and the living cells samples while holding the scanning parameters and the micropipettes constant and unchanged. The imaging quality and stability of the two scanning modes was then evaluated using the mean squared height fluctuation of the scanning images, given as (Zhuang et al, 2016) where M × N denotes the number of pixels in each image; L is the recorded total number of images in each scanning mode; f k ( i , j ) the height value of the pixel with coordinates ( i , j ) in the k th image; and is the mean value of f k ( i , j ) for L images.…”

Section: Resultsmentioning

confidence: 99%

Smart Scanning Ion-Conductance Microscopy Imaging Technique Using Horizontal Fast Scanning Method

Zhuang

Wang

et al. 2018

Microsc Microanal

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To solve extended acquisition time issues inherent in the conventional hopping-scanning mode of scanning ion-conductance microscopy (SICM), a new transverse-fast scanning mode (TFSM) is proposed. Because the transverse motion in SICM is not the detection direction and therefore presents no collision problem, it has the ability to move at high speed. In TSFM, the SICM probe gradually descends in the vertical/detection direction and rapidly scans in the transverse/nondetection direction. Further, the highest point that decides the hopping height of each scanning line can be quickly obtained. In conventional hopping mode, however, the hopping height is artificially set without a priori knowledge and is typically very large. Consequently, TFSM greatly improves the scanning speed of the SICM imaging system by effectively reducing the hopping height of each pixel. This study verifies the feasibility of this novel scanning method via theoretical analysis and experimental study, and compares the speed and quality of the scanning images obtained in the TFSM with that of the conventional hopping mode. The experimental results indicate that the TFSM method has a faster scanning speed than other SICM scanning methods while maintaining the quality of the images. Therefore, TFSM provides the possibility to quickly obtain high-resolution three-dimensional topographical images of extremely complex samples.

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“…Zhuang et al [48] exploited a novel scanning mode. Here, the pipette movement could be predicted, which optimised the scanning trajectory and enhanced the imaging rate.…”

Section: Improvementsmentioning

confidence: 99%

Recent development of samples’ surface properties using scanning ion conductance microscopy

Wei

2019

Micro & Nano Letters

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Scanning ion conductance microscopy has a widespread application in imaging non-conductive substrates, especially biological samples due to its high-resolution and non-contact imaging. In this work, state-of-the-art achievements on exploring samples' surface properties including surface morphology, sample conductivity and dynamics using scanning ion conductance microscopy are firstly introduced, which confirm that scanning ion conductance microscopy is such a mature technology that realises non-invasive and high-resolution imaging. Then, combinations with scanning electrochemical microscopy and atomic force microscopy are demonstrated, which realise the multifunction of scanning ion conductance microscopy. Furthermore, improvements that can help enhance the imaging rate are presented. Finally, the future direction of scanning ion conductance microscopy is discussed.

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A new scanning mode to improve scanning ion conductance microscopy imaging rate with pipette predicted movement

Cited by 18 publications

References 23 publications

Nanoscale Electrochemical Mapping

Nanoscale Electrochemical Mapping

Smart Scanning Ion-Conductance Microscopy Imaging Technique Using Horizontal Fast Scanning Method

Recent development of samples’ surface properties using scanning ion conductance microscopy

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