1983
DOI: 10.1016/0375-9601(83)90761-2
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A new observation method of ion-electron emission

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Cited by 3 publications
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“…Usually, therole of embeddedprojectiles and adsorbedor contaminant particles as a source of electrons is neglected. Such treatment of the electron emission problem is not correct because, if the measurements have been performed in a differential manner, the presence of such particles is manifested by some structure in the energy and angular distributions (Soszka and Soszka 1983). The surface adsorbed layer essentially determines the features of the ion-electron emission under 'classical vacuum conditions' (Arifov 1969).…”
Section: Introductionmentioning
confidence: 99%
“…Usually, therole of embeddedprojectiles and adsorbedor contaminant particles as a source of electrons is neglected. Such treatment of the electron emission problem is not correct because, if the measurements have been performed in a differential manner, the presence of such particles is manifested by some structure in the energy and angular distributions (Soszka and Soszka 1983). The surface adsorbed layer essentially determines the features of the ion-electron emission under 'classical vacuum conditions' (Arifov 1969).…”
Section: Introductionmentioning
confidence: 99%