“…In common with the analog methods described above, the transient can be digitally correlated with a boxcar, lock-in, or exponentially decaying function, and used to build a set of DLTS scans. 10 Alternatively, the transient can be analyzed using spectral analysis DLTS, 11,12 Fourier transform analysis, [13][14][15] nonlinear least square fitting, 16 the modulation function method, 17 the method of moments, 18,19 the correlation method of linear predictive modeling, 20 or other digital methods. 21 Since the whole transient is recorded, it is necessary to perform just one experimental temperature scan, which greatly reduces the time needed to perform the experiment.…”