A new method to analyze multiexponential transients for deep-level transient spectroscopy

Hanak, Thomas R.; Ahrenkiel, R. K.; Dunlavy, D. J.; Bakry, Assem; Timmons, Michael B.

doi:10.1063/1.344973

Cited by 17 publications

(14 citation statements)

References 13 publications

(2 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…As for the nonlinear double exponential fitting technique for a two trap model [17], considering the equation…”

Section: Methods Of Calculationmentioning

confidence: 99%

“…An additional advantage of the lower measuring frequency is that shallow levels can respond to the signal at lower temperature. The experimental setup used for digitally recording the capacitance transients for the double exponential fitting method was previously explained [17].…”

Section: Methodsmentioning

confidence: 99%

“…A previous attempt has been published by the author and others [17] to analyze multi-exponential transients using a nonlinear double exponential fitting routine. This technique was successfully applied to a two-trap model yielding the thermal activation energies and capture cross sections of the two closely spaced traps.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

A new method to analyze closely spaced deep defect levels caused by multiexponential transients

Bakry

2013

2013 Saudi International Electronics, Communications and Photonics Conference

View full text Add to dashboard Cite

A new method is presented to analyze nonexponential capacitance transients, caused by closely-spaced deep defect levels active at the same temperature range, into the appropriate components. It is capable to resolve deep-level transient spectroscopy (DLTS) signals having one or more shoulders, generated by two or more trap levels. Closely-spaced traps are accompanied by the observation of multiple emission rates making the differentiation between them almost impossible using conventional analysis techniques. The proposed method utilizes a hybrid between the conventional DLTS technique, based on Lang's method [1], and the non-linear double exponential fitting routine previously published by the author. This technique was successfully tested on Se-doped n-type Al x Ga 1-x As sample, having what is known as DX centers, and was capable of resolving up to seven deep levels with activation energies ranging from 270 -486 meV.

show abstract

“…As for the nonlinear double exponential fitting technique for a two trap model [17], considering the equation…”

Section: Methods Of Calculationmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

See 1 more Smart Citation

A new method to analyze closely spaced deep defect levels caused by multiexponential transients

Bakry

2013

2013 Saudi International Electronics, Communications and Photonics Conference

View full text Add to dashboard Cite

show abstract

“…The noisy signal is first digitized and then processed using various digital techniques. [10][11][12][13][14][15][16][17][18][19][20] The transient parameter analysis can take place during the experiment, or data can be stored for later analysis. In common with the analog methods described above, the transient can be digitally correlated with a boxcar, lock-in, or exponentially decaying function, and used to build a set of DLTS scans.…”

Section: B Digital Methodsmentioning

confidence: 99%

“…In common with the analog methods described above, the transient can be digitally correlated with a boxcar, lock-in, or exponentially decaying function, and used to build a set of DLTS scans. 10 Alternatively, the transient can be analyzed using spectral analysis DLTS, 11,12 Fourier transform analysis, [13][14][15] nonlinear least square fitting, 16 the modulation function method, 17 the method of moments, 18,19 the correlation method of linear predictive modeling, 20 or other digital methods. 21 Since the whole transient is recorded, it is necessary to perform just one experimental temperature scan, which greatly reduces the time needed to perform the experiment.…”

Section: B Digital Methodsmentioning

confidence: 99%

Averaging and recording of digital deep-level transient spectroscopy transient signals

Kolev

Deen

Alberding

1998

Review of Scientific Instruments

View full text Add to dashboard Cite

A new approach to the signal processing in digital deep-level transient spectroscopy ͑DLTS͒ systems is introduced. The problems of signal recovery from noise and efficient data storage are addressed separately from the transient signal analysis. As a result of this approach, an improved digital averaging scheme for DLTS signal recovery from noise and transient data storage is proposed. We have shown that the combined action of two complementary digital averaging techniques can improve the DLTS digital signal processing. Pseudologarithmic time averaging is efficient in reducing the number of processed data points and improving the signal-to-noise ratio for the high frequency noise components and in the transient tail. We demonstrate that the normalized errors in the magnitude measurements introduced by this type of averaging remain below 1% for pure logarithmic and below 0.1% provided that the logarithmic averaging intervals are further divided into five or more equal parts. Continuous time averaging is well suited for improving overall signal-to-noise ratio, for continuous display and processing of data, and it is more efficient in using the computer resources. The described combination of hardware and software tools for the implementation of these techniques supplies continuously fresh data and does not require any synchronization with the main computer program. Compared to other digital DLTS systems, this new approach offers an improved short delay time resolution, improved signal-to-noise ratio, and more efficient data storage. At the same time it offers real-time observation of essentially noise-free transients and, like analog systems, a real-time display of the DLTS scan. The real-time display means that the displayed transient and DLTS scan can be updated on the computer screen after each pulse even for a very large number of averaged pulses, and the result can be predicted well before the acquisition process reaches this number. The proposed techniques allow one to combine the powerful transient analysis of the digital DLTS methods with the sensitivity and the convenience of the analog methods. The described averaging and data reduction techniques are intended primarily for DLTS data processing, but the same principles can be useful for many other physical experiments involving transient data analysis.

show abstract

Evidence of interaction between two DX centers in N-Type AlGaAs from RDLTS and temperature dependent pulse-width DLTS measurements

Wang

Boone

et al. 1993

J. Electron. Mater.

View full text Add to dashboard Cite

A new method to analyze multiexponential transients for deep-level transient spectroscopy

Abstract: Articles you may be interested inA simple and inexpensive circuit for emission and capture deep level transient spectroscopy Rev.

Cited by 17 publications

References 13 publications

A new method to analyze closely spaced deep defect levels caused by multiexponential transients

A new method to analyze closely spaced deep defect levels caused by multiexponential transients

Averaging and recording of digital deep-level transient spectroscopy transient signals

Evidence of interaction between two DX centers in N-Type AlGaAs from RDLTS and temperature dependent pulse-width DLTS measurements

Contact Info

Product

Resources

About