A New Method of Surface Preparation for High Spatial Resolution EPMA/SEM with an Argon Ion Beam

The metastable β -phase morphology, inherent to most polyfl uorene homopolymers, is of interest due to its superior optical and electrical characteristics compared to its amorphous analogue. Here, a polyfl uorene with vinyl-etherfunctionalized aliphatic side-chains that allow crosslinking is reported. It is demonstrated that the previously induced conformational morphology is preserved in the resulting polyfl uorene network, which enables subsequent wet thin-fi lm processing. Electron-beam lithography provides a means for sub-(optical)-wavelength patterning of the crosslinkable polyfl uorene fi lms. As a specifi c demonstration, optically-pumped distributed-feedback (DFB) lasers made from surface-relief gratings in amorphous and β -phase polyfl uorene are presented. By backfi lling gratings of one morphology by the other, devices are demonstrated that exhibit lasing at two wavelengths with a threshold ( < 1 μ J cm − 2 ) at least an order of magnitude lower compared with previous data.

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“…Polishing of the crosssection was performed on a Jeol SM09010 CSP with an Argon ion beam at 5 kV. [15] …”

Section: Amplifi Ed Spontaneous Emission From Ve-pfo and Pfo Films Anmentioning

confidence: 99%

Sub‐Micrometer Patterning of Amorphous‐ and β‐Phase in a Crosslinkable Poly(9,9‐dioctylfluorene): Dual‐Wavelength Lasing from a Mixed‐Morphology Device

Kuehne

Kaiser

Mackintosh

et al. 2011

Adv Funct Materials

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“…First, early experiments demonstrated the potential for achieving submicrometer grains in this alloy by HPT processing [18,19]. Second, this alloy responds well to preparation using ion beam cross-sectional polishing [20] and it is therefore possible to produce wide areas for inspection using scanning electron microscopy (SEM). Furthermore, and as demonstrated in a recent report [21], this procedure may be used for grain size determinations because the ion-polished surfaces provide very clear images of the grain boundaries in the SEM with enhanced electron channeling contrast.…”

Section: Introductionmentioning

confidence: 99%

Significance of strain reversals in a two-phase alloy processed by high-pressure torsion

Kawasaki

Ahn

Langdon

2010

Materials Science and Engineering: A

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“…Then the prepolished surfaces were Ar ion milled for 12–15 h under an accelerating voltage of 5 kV and an ion beam current of 0.1 mA using a JEOL SM‐09010 cross‐section polisher (Jeol Ltd., Tokyo, Japan). By ion milling, an approximately 50‐μm‐thick layer is removed from the mechanically prepolished surface, and an area of a few millimeter square of the underlying material is exposed without mechanical impact 13,14 . Shorter ion‐milling times of a few hours are applicable to achieve a slightly smaller polished area.…”

Section: Methodsmentioning

confidence: 99%

Direct Scanning Electron Microscopy Imaging of Ferroelectric Domains After Ion Milling

Grüner

Shen

2009

Journal of the American Ceramic Society

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A method for directly observing the ferroelectric domain structure by scanning electron microscopy after argon ion milling has been established. Its advantages are exemplified by exposing the domain structure in three widely used ferroelectric ceramics, BaTiO3, (Na,K)NbO3, and Pb(Ti,Zr)O3. Stable high‐resolution images revealing domains with widths <30 nm have been obtained. The domain contrast is caused by electron channeling and is strongly dependent on the sample tilt angle. Owing to a strain‐ and defect‐free surface generated by gentle ion milling, pronounced orientation contrast is observed.

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A New Method of Surface Preparation for High Spatial Resolution EPMA/SEM with an Argon Ion Beam

Cited by 31 publications

References 2 publications

Sub‐Micrometer Patterning of Amorphous‐ and β‐Phase in a Crosslinkable Poly(9,9‐dioctylfluorene): Dual‐Wavelength Lasing from a Mixed‐Morphology Device

Sub‐Micrometer Patterning of Amorphous‐ and β‐Phase in a Crosslinkable Poly(9,9‐dioctylfluorene): Dual‐Wavelength Lasing from a Mixed‐Morphology Device

Significance of strain reversals in a two-phase alloy processed by high-pressure torsion

Direct Scanning Electron Microscopy Imaging of Ferroelectric Domains After Ion Milling

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