1990
DOI: 10.1109/55.55272
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A new lateral MOS-controlled thyristor

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Cited by 16 publications
(4 citation statements)
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“…As a key device for power conversion and control, the LTT is required to withstand a high critical rate of rise of off-state voltage (dv/dt capability) to cope with emergencies such as surge voltage in the circuit [1,2]. The conventional solution is to employ a cathode short structure in the N + cathode so that part of the P base region is directly connected to the cathode metal, thereby the surge current can be quickly released to prevent the device from false triggering of inappropriate dv/dt behavior [3][4][5][6][7]. This solution can be used * Author to whom any correspondence should be addressed.…”
Section: Introductionmentioning
confidence: 99%
“…As a key device for power conversion and control, the LTT is required to withstand a high critical rate of rise of off-state voltage (dv/dt capability) to cope with emergencies such as surge voltage in the circuit [1,2]. The conventional solution is to employ a cathode short structure in the N + cathode so that part of the P base region is directly connected to the cathode metal, thereby the surge current can be quickly released to prevent the device from false triggering of inappropriate dv/dt behavior [3][4][5][6][7]. This solution can be used * Author to whom any correspondence should be addressed.…”
Section: Introductionmentioning
confidence: 99%
“…1) Lateral MOSgated thyristors have also attracted considerable attention for integration with complementary MOS (CMOS) in power ICs. 2,3) Among these devices, the lateral EST (LEST), a cross-sectional view of which is shown in Fig. 1, may be promising due to its unique gate-control current saturation characteristics, which ensure a wide safe operating area (SOA).…”
Section: Introductionmentioning
confidence: 99%
“…Lateral MOS-controllable thyristors offer a very low on-state resistance when compared to LDMOSFETs [l] or LIGBTs [2], however, the turn-off mechanism by short circuiting the cathode junction through a MOSFET channel [3] has been found difficult to control. In addition, in MOS controllable thyristors, due to the absence of the MOS-gate control during the on-state operation, the Safe Operating Area (SOA) is reduced when compared to LIGBTs or LDMOSFETs.…”
Section: Introductionmentioning
confidence: 99%