2016
DOI: 10.1109/tmtt.2016.2594234
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A New GaN HEMT Equivalent Circuit Modeling Technique Based on X-Parameters

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Cited by 29 publications
(35 citation statements)
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“…The yellow ones relate harmonics with subscripts with the same sign in the input and output spectra. They are usually called Y S in the bibliography [5], [6] through the analogy with the X-parameter subsets. The blue ones relate harmonics with subscripts with different signs and are usually called Y T .…”
Section: (9)mentioning
confidence: 99%
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“…The yellow ones relate harmonics with subscripts with the same sign in the input and output spectra. They are usually called Y S in the bibliography [5], [6] through the analogy with the X-parameter subsets. The blue ones relate harmonics with subscripts with different signs and are usually called Y T .…”
Section: (9)mentioning
confidence: 99%
“…Taking into account the relationship between currents and voltages and incident and scattered waves [5], [6] it is straightforward to demonstrate that:…”
Section: Obtaining X Parameters From the Admittance Y Matrixmentioning
confidence: 99%
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“…As the SSEC model connects the physical device structure to its circuit analysis, it enables study of the microwave and RF performance with device geometrical parameters. In this case, different procedures have been proposed to extract the SSEC parameters of microwave heterostructure devices from S‐parameters. During working with S‐parameters at higher frequencies require accurate transistor models up to micro/millimeter‐wave frequencies.…”
Section: Introductionmentioning
confidence: 99%
“…Accordingly, many researchers pay more attention on the characteristics of devices made from GaN process. So far, much advancement has been made about active devices, not only in effects like drain current instability [3] and effect of fringing capacitance [4] but also in modeling like the equivalent model of GaN HEMT [5,6]. However, the lack of modeling of passive devices, especially transmission lines, caused much trouble in actual circuit simulation, reflecting in the difference between pre-simulation and post-simulation.…”
Section: Introductionmentioning
confidence: 99%