A new free-wave dielectric and magnetic properties measurement system at millimetre wavelengths

Khosrowbeygi, A.; Griffiths, HD; Cullen, A.L.

doi:10.1109/mwsym.1994.335136

Cited by 13 publications

(4 citation statements)

References 4 publications

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“…9, where (f r min ) −2 and (f t min ) −2 are plotted as a function of sample . Since there is a linear relationship, the sensor can be calibrated using two measurements, and permittivities of unknown materials can be calculated using the relationship presented in (9).…”

Section: A Extraction Of the Sample Permittivitymentioning

confidence: 99%

Material Characterization Using Complementary Split-Ring Resonators

Boybay¹,

Ramahi²

2012

IEEE Trans. Instrum. Meas.

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A microwave method based on complementary split-ring resonators (CSRRs) is proposed for dielectric characterization of planar materials. The technique presents advantages such as high measurement sensitivity and eliminates the extensive sample-preparation procedure needed in resonance-based methods. A sensor in the shape of CSRRs working at a 0.8-1.3-GHz band is demonstrated. The sensor is etched in the ground plane of a microstrip line to effectively create a stopband filter. The frequencies at which minimum transmission and minimum reflection are observed depend on the permittivity of the sample under test. The minimum transmission frequency shifts from 1.3 to 0.8 GHz as the sample permittivity changes from 1 to 10. The structure is fabricated using printed circuit board technology. Numerical findings are experimentally verified.

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Section: A Extraction Of the Sample Permittivitymentioning

confidence: 99%

Material Characterization Using Complementary Split-Ring Resonators

Boybay¹,

Ramahi²

2012

IEEE Trans. Instrum. Meas.

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“…𝜀 𝑀𝑈𝑇 = −1.717(𝑓 ℎ ) 3 + 16.67(𝑓 ℎ ) 2 − 55.88(𝑓 ℎ ) + 65.74 (4) 𝜀 𝑀𝑈𝑇 = −9.09(𝑓 𝑟 ) 3 + 64.11(𝑓 𝑟 ) 2 − 156.2(𝑓 𝑟 ) + 132.1 (5) and the derivative of εMUT with respect to fh and fr are computed as:…”

Section: Sensor Analysismentioning

confidence: 99%

“…The free space method commonly employs the extremely directive lens and horn antennas laid on both sides of the MUT. The vector network analyzer (VNA) is connected to the antennas to measure the scattering parameters and phase constant to describe the specimen [2][3][4][5]. This technique has the advantage of being contactless and not wasteful, but it needs to employ of costly antennas and lenses, as well as the requirement of a big specimen.…”

Section: Introductionmentioning

confidence: 99%

Complimentary split ring resonator sensor with high sensitivity based on material characterization

2020

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A new model of microwave planar sensor established on the complementary split ring resonator (CSRR) as well as an air hole in substrate of the structure is introduced for a precise measurement of materials permittivity. The hole is filled into substrate of the planar microstrip line. The CSRR structure with hole is selected for the sensitivity analysis, the result is established to hold over quite sensitive compared with CSRR structure without hole and thus evidence to be more suitable for the sensor design. The sensor in the form of CSRRs operating at a 1.74-3.4 GHz band is explained. At resonance, it is found that the electric field produced straight the plane of CSRR being highly sensitive for the characterization of sample resident with the sensor. The minimum transmission frequency of sensor shifts from 3.4 to 1.74 GHz as the sample permittivity varies from 1 to 10. A numerical paradigm is introduced herein for the computation of the system resolution as a assignment of resonance frequency and sample permittivity using electromagnetic simulator. It is found that the proposed sensor provides 35% increment in sensitivity more than conventional sensor for same permittivity of the specimen.

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“…Errors arising from multiple reflections between the sample and antennas can be reduced by placing the sample such that it is not perpendicular to the direction of incident radiation [5], [6]. Errors from multiple reflections can be also eliminated by applying time gating function of modern network analyzers [6], [7] or by measuring the response to a picosecond pulse of radiation [8]. Diffraction on the edges is usually reduced by using samples of larger diameter.…”

Section: Introductionmentioning

confidence: 99%

Complex permittivity measurements of dielectrics and semiconductors at millimeter waves with high power sources

Afsar

Korolev

Subramanian

et al. 2005

IEEE MTT-S International Microwave Symposium Digest, 2005.

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We present complex dielectric permittivity measurements of various semiconductor and dielectric materials, including highly absorbing substances, in Q-, V-and W-band frequencies. The measurements have been done using broadband quasi-optical millimeter wave system with a backwardwave oscillator as a high power source of radiation. Frequency dependencies of real and imaginary parts of dielectric permittivity are calculated from the transmittance spectra. Complex dielectric permittivity data, obtained using both waveguide bridge technique and free space measurements have been compared with previously published results.

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A new free-wave dielectric and magnetic properties measurement system at millimetre wavelengths

Cited by 13 publications

References 4 publications

Material Characterization Using Complementary Split-Ring Resonators

Material Characterization Using Complementary Split-Ring Resonators

Complimentary split ring resonator sensor with high sensitivity based on material characterization

Complex permittivity measurements of dielectrics and semiconductors at millimeter waves with high power sources

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