Mg 0.95 Ni 0.05 Ti 0.98 Zr 0.02 O 3 ceramics was prepared via conventional solid-state mixed-oxide route. The phase, microstructure and microwave dielectric properties of the sintered samples were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and a vector network analyzer. The microstructure comprised of circular and elongated plate-like grains. The semi quantitative analysis (EDS) of the circular and elongated grains revealed the existence of Mg 0.95 Ni 0.05 T 2 O 5 as a secondary phase along with the parent Mg 0.95 Ni 0.05 Ti 0.98 Zr 0.02 O 3 phase, which was consistent with the XRD findings. In the present study, ε r ∼17.1, Q u f o ∼195855 ± 2550 GHz and τ f ∼ −46 ppm/K was achieved for the synthesized Mg 0.95 Ni 0.05 Ti 0.98 Zr 0.02 O 3 ceramics sintered at 1325°C for 4 h.