A nanofabricated wirescanner with free standing wires: Design, fabrication and experimental results

Veronese, M.; Grulja, S.; Penco, G.; Ferianis, M.; Fröhlich, Lars; Zilio, Simone Dal; Greco, Silvio Mario Luciano; Lazzarino, Marco

doi:10.1016/j.nima.2018.02.040

Cited by 4 publications

(3 citation statements)

References 11 publications

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“…At FERMI, the WS nano-fabrication strategy was different. A first WS prototype consisting of a 10 µm wide Ag/Si 3 N 4 /Ag stripe free-standing onto a Silicon frame was initially nano-fabricated and tested at FERMI [14]. Finally, an upgrade of the previous free-standing WS solution consisting of a 0.8 mm long and 900 nm wide Au/Si 3 N 4 /Au stripe has been produced at FERMI, see fig.…”

Section: B Nano-fabricated Wire-scanners: First Developmentsmentioning

confidence: 99%

“…In order to improve the WS spatial resolution, new fabrication techniques are under investigation at PSI and FERMI. At PSI, a WS prototype with a sub-micrometer resolution nano-fabricated on-amembrane (250 nm thick Silicon Nitride membrane) was successfully tested [13]; while at FERMI a free-standing nanofabricated WS with a resolution of about 10 µm has been successfully tested [14]. These experiences paved the way to use the nano-litography technique to fabricate free-standing WS with sub-micrometer resolution, a goal that PSI and FERMI have independently pursued.…”

Section: Introductionmentioning

confidence: 99%

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Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution

Orlandi

Dávid²,

Guzenko³

et al. 2020

Phys. Rev. Accel. Beams

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Diagnostics of the beam transverse profile with ever more demanding spatial resolution is required by the progress on novel particle accelerators -such as laser and plasma driven accelerators -and by the stringent beam specifications of the new generation of X-ray facilities. In a linac driven Free-Electron-Laser (FEL), the spatial resolution constraint joins with the further requirement for the diagnostics to be minimally invasive in order to protect radiation sensitive components -such as the undulators -and to preserve the lasing mechanism. As for high resolution measurements of the beam transverse profile in a FEL, wire-scanners (WS) are the top-ranked diagnostics. Nevertheless, conventional WS consisting of a metallic wire (beam-probe) stretched onto a frame (fork) can provide at best a rms spatial resolution at the micrometer scale along with an equivalent surface of impact on the electron beam. In order to improve the spatial resolution of a WS beyond the micrometer scale along with the transparency to the lasing, PSI and FERMI are independently pursuing the technique of the nano-lithography to fabricate a free-standing and sub-micrometer wide WS beam-probe fully integrated into a fork. Free-standing WS with a geometrical resolution of about 250 nm have been successfully tested at SwissFEL where low charge electron beams with a vertical size of 400 − 500 nm have been characterized. Further experimental tests carried out at SwissFEL at the nominal beam charge of 200 pC confirmed the resilience to the heat-loading of the nano-fabricated WS. In this work, details on the nano-fabrication of free-standing WS as well as results of the electron-beam characterization are presented.

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Section: B Nano-fabricated Wire-scanners: First Developmentsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution

Orlandi

Dávid²,

Guzenko³

et al. 2020

Phys. Rev. Accel. Beams

Self Cite

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“…[15,16]) (speed of scan up to 20 m/s). Note the trend in the development of wire scanners with very short wires using nanofabrication technologies, designed to measure beams with sizes smaller than a few hundred microns [17,18]. Instead of measuring the flow of the scattered particles from the wire, a method has been developed to measure the secondary current generated by electron emission from the wire (see [10,11] for an introduction to the method).…”

Section: Introductionmentioning

confidence: 99%

Vibrating wire monitor: Versatile instrumentation for particle and photon beam measurements with wide dynamic range

et al. 2021

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The vibrating wire monitor proposed herein is based on the strong dependence of the frequency of the pinched wire on its temperature. This dependence allows the measurement of a particle/X-ray/gamma-ray beam that deposits part of its energy on the wire. A wide measured temperature range from fractions of mK to hundreds of degrees allows the detection of beam properties at a given position of the wire in space. It also enables preparing profiling of a beam in a large dynamic range by scanning the wire through the beam. This review paper presents information on various applications of a vibrating wire, including the method of resonance target and the use of wire oscillations as a scanner for the profiling of thin beams. K: Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors); Instrumentation for particle accelerators and storage rings -high energy (linear accelerators, synchrotrons); Instrumentation for particle accelerators and storage rings -low energy (linear accelerators, cyclotrons, electrostatic accelerators); Instrumentation for synchrotron radiation accelerators

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Generation and measurement of sub-micrometer relativistic electron beams

et al. 2018

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The generation of low-emittance electron beams has received significant interest in recent years. Driven by the requirements of X-ray free electron lasers, the emittance of photocathode injectors has been reduced significantly, with a corresponding increase in beam brightness. At the same time, this has put increasingly stringent requirements on the instrumentation to measure the beam size. These requirements are even more stringent for novel accelerator developments, such as laser-driven accelerators based on dielectric structures or on a plasma, or for linear colliders at the energy frontier. We present here the generation and measurement of a sub-micrometer electron beam, at a particle energy of 330 MeV, and a bunch charge below 1 pC. An electron beam optics with a β -function of a few millimeters in the vertical plane had been set up. The beam was characterized through a wire scanner that employs a 1 µm wide metallic structure fabricated using the electron beam lithography on a silicon nitride membrane. The smallest (rms) beam size presented here is less than 500 nm.

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A nanofabricated wirescanner with free standing wires: Design, fabrication and experimental results

Cited by 4 publications

References 11 publications

Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution

Nanofabricated free-standing wire scanners for beam diagnostics with submicrometer resolution

Vibrating wire monitor: Versatile instrumentation for particle and photon beam measurements with wide dynamic range

Generation and measurement of sub-micrometer relativistic electron beams

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