2017
DOI: 10.1016/j.microrel.2017.05.020
|View full text |Cite
|
Sign up to set email alerts
|

A multiscale analytical correction technique for two-dimensional thermal models of AlGaN/GaN HEMTs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
4
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
7
1

Relationship

1
7

Authors

Journals

citations
Cited by 11 publications
(4 citation statements)
references
References 25 publications
0
4
0
Order By: Relevance
“…Due to the intrinsic nature of GaN HEMTs, harsh and localized self-heating in the conducting channel may occur [26]; this effect increases with the device power density and further compromises reliability [22,27]. On one side, the electrical behavior of the traps mentioned in the above paragraph is temperature-dependent [25].…”
mentioning
confidence: 99%
“…Due to the intrinsic nature of GaN HEMTs, harsh and localized self-heating in the conducting channel may occur [26]; this effect increases with the device power density and further compromises reliability [22,27]. On one side, the electrical behavior of the traps mentioned in the above paragraph is temperature-dependent [25].…”
mentioning
confidence: 99%
“…Various design improvements have been developed in recent years to overcome the limitations of these heterojunction-based HEMTs as biosensors in order to achieve their optimum potential. These structural design improvements and advancements were thoroughly investigated to determine which could provide better stability and sensitivity to the biosensor [ 29 , 30 , 31 ].…”
Section: Introductionmentioning
confidence: 99%
“…Typically, a standard package is used to dissipate the generated heat, and to protect the active region and miniature bonding wires. Resultant thermal resistance from the active region towards package, and then towards any extended surfaces to the ambient, determines the T j [20,21]. In an interrelated manner, T j alters the temperature-dependent radiative and non-radiative recombinations of SSL devices, as well as carrier leakage from active regions in some instances [22], which all can be summarized as thermal droop.…”
Section: Introductionmentioning
confidence: 99%