“…A major application area for the PEA is represented by scanning probe measurement systems such as atomic force microscopy (AFM) 9 , scanning tunneling microscopy (STM) 3,4,10,11 , and scanning tunneling spectroscopy (STS) 12 . The recent developments in the fields of STM 3,4 , STS 12 and in particular of point contact spectroscopy (PCS) including point contact Andreev reflection spectroscopy (PCAR) 2,[13][14][15][16][17][18][19][20] , have underlined the relevance of PEA for nanopositioning applications. With the emergence of new families of quantum materials encompassing topological insulators 21 , topological crystalline insulators 22 , topological superconductors 23 , Weyl and Dirac semimetals 24 and unconventional superconductors 25 including heavy fermionic systems 25 , PCS and PCAR have proven to be efficient spectroscopic tools to study these material systems 26 .…”